公开(公告)号：US20240087663A1

公开(公告)日：2024-03-14

申请号：US17944135

申请日：2022-09-13

Applicant: Micron Technology, Inc.

Inventor： William Yu ,  Daniele Balluchi ,  Danilo Caraccio ,  Thomas T. Tangelder ,  Jacob S. Robertson ,  James G. Steele ,  Joemar Sinipete

IPC: G11C29/36 ,  G11C29/02 ,  G11C29/42

CPC classification number: G11C29/36 ,  G11C29/022 ,  G11C29/42 ,  G11C2029/3602

Abstract: Methods, systems, and devices related to built-in self-test (BIST) circuitry of a controller. The controller can be coupled to multiple memory devices. The BIST circuitry can include registers configured to store burst patterns. The BIST circuitry can perform a BIST operation on the memory devices contemporaneously and using the number of burst patterns.