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公开(公告)号：US12293803B2
公开(公告)日：2025-05-06
申请号：US17943706
申请日：2022-09-13
Applicant: Micron Technology, Inc.
Inventor： William Yu , Daniele Balluchi , Chad B. Erickson , Danilo Caraccio
Abstract: Methods, systems, and devices related to built-in self-test burst patterns based on architecture of memory. A controller can be coupled to a memory device. The controller can include built-in self-test (BIST) circuitry. The BIST circuitry can include registers configured to store respective write burst patterns and read burst patterns based on an architecture of the memory device.
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公开(公告)号：US20240087663A1
公开(公告)日：2024-03-14
申请号：US17944135
申请日：2022-09-13
Applicant: Micron Technology, Inc.
Inventor： William Yu , Daniele Balluchi , Danilo Caraccio , Thomas T. Tangelder , Jacob S. Robertson , James G. Steele , Joemar Sinipete
CPC classification number: G11C29/36 , G11C29/022 , G11C29/42 , G11C2029/3602
Abstract: Methods, systems, and devices related to built-in self-test (BIST) circuitry of a controller. The controller can be coupled to multiple memory devices. The BIST circuitry can include registers configured to store burst patterns. The BIST circuitry can perform a BIST operation on the memory devices contemporaneously and using the number of burst patterns.
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公开(公告)号：US20240087664A1
公开(公告)日：2024-03-14
申请号：US17943706
申请日：2022-09-13
Applicant: Micron Technology, Inc.
Inventor： William Yu , Daniele Balluchi , Chad B. Erickson , Danilo Caraccio
CPC classification number: G11C29/38 , G11C29/10 , G11C29/1201
Abstract: Methods, systems, and devices related to built-in self-test burst patterns based on architecture of memory. A controller can be coupled to a memory device. The controller can include built-in self-test (BIST) circuitry. The BIST circuitry can include registers configured to store respective write burst patterns and read burst patterns based on an architecture of the memory device.
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