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公开(公告)号:US20200177205A1
公开(公告)日:2020-06-04
申请号:US16205075
申请日:2018-11-29
Applicant: Micron Technology, Inc.
Inventor: Wei Wu , Zhenlei Shen , Zhengang Chen
Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting layout constitutes a Latin Square (LS) layout.
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公开(公告)号:US11870461B2
公开(公告)日:2024-01-09
申请号:US17880144
申请日:2022-08-03
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Wei Wu , Zhenlei Shen , Zhengang Chen
CPC classification number: H03M13/1525 , G06F11/1076
Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting (EC) layout constitutes a first layout in the form of a Latin Square.
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公开(公告)号:US11438012B2
公开(公告)日:2022-09-06
申请号:US16205075
申请日:2018-11-29
Applicant: Micron Technology, Inc.
Inventor: Wei Wu , Zhenlei Shen , Zhengang Chen
Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting layout constitutes a Latin Square (LS) layout.
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公开(公告)号:US20220376709A1
公开(公告)日:2022-11-24
申请号:US17880144
申请日:2022-08-03
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Wei Wu , Zhenlei Shen , Zhengang Chen
Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting (EC) layout constitutes a first layout in the form of a Latin Square.
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