Patent search ap:("Micron Technology Page Inc.") AND inv:"Wei Wu"

1.

发明申请
FAILURE-TOLERANT ERROR CORRECTION LAYOUT FOR MEMORY SUB-SYSTEMS 审中-公开

公开(公告)号：US20200177205A1

公开(公告)日：2020-06-04

申请号：US16205075

申请日：2018-11-29

Applicant: Micron Technology, Inc.

Inventor： Wei Wu , Zhenlei Shen , Zhengang Chen

IPC: H03M13/15 , G06F11/10

Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting layout constitutes a Latin Square (LS) layout.

2.

发明授权
Failure-tolerant error correction layout for memory sub-systems 有权

公开(公告)号：US11870461B2

公开(公告)日：2024-01-09

申请号：US17880144

申请日：2022-08-03

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Wei Wu , Zhenlei Shen , Zhengang Chen

IPC: H03M13/15 , G06F11/10

CPC classification number: H03M13/1525 , G06F11/1076

Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting (EC) layout constitutes a first layout in the form of a Latin Square.

3.

发明授权
Failure-tolerant error correction layout for memory sub-systems 有权

公开(公告)号：US11438012B2

公开(公告)日：2022-09-06

申请号：US16205075

申请日：2018-11-29

Applicant: Micron Technology, Inc.

Inventor： Wei Wu , Zhenlei Shen , Zhengang Chen

IPC: H03M13/15 , G06F11/10

Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting layout constitutes a Latin Square (LS) layout.

4.

发明申请
FAILURE-TOLERANT ERROR CORRECTION LAYOUT FOR MEMORY SUB-SYSTEMS 有权

公开(公告)号：US20220376709A1

公开(公告)日：2022-11-24

申请号：US17880144

申请日：2022-08-03

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Wei Wu , Zhenlei Shen , Zhengang Chen

IPC: H03M13/15 , G06F11/10

Abstract: Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting (EC) layout constitutes a first layout in the form of a Latin Square.

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