OPTICAL WAVEGUIDE SENSOR CHIP, OPTICAL WAVEGUIDE SENSOR, AND METHOD FOR MANUFACTURING OPTICAL WAVEGUIDE SENSOR CHIP
    1.
    发明申请
    OPTICAL WAVEGUIDE SENSOR CHIP, OPTICAL WAVEGUIDE SENSOR, AND METHOD FOR MANUFACTURING OPTICAL WAVEGUIDE SENSOR CHIP 有权
    光波导传感器芯片,光波导传感器和制造光波导传感器芯片的方法

    公开(公告)号:US20120014638A1

    公开(公告)日:2012-01-19

    申请号:US13176976

    申请日:2011-07-06

    IPC分类号: G02B6/00 G02B6/34

    摘要: According to one embodiment, an optical waveguide sensor chip includes an optical waveguide layer; a pair of optical elements disposed at both ends of the optical waveguide layer so that light enters the optical waveguide layer and the light exits from the optical waveguide layer; a functional film formed on a predetermined region of the optical waveguide layer; a covering layer formed in a planar region on the light entrance surface of the optical waveguide layer, in which at least the optical elements are disposed; a first through hole configured to allow the light entering the entrance-side optical element to pass therethrough; and a second through hole configured to allow the light exiting from the exit-side optical element to pass therethrough.

    摘要翻译: 根据一个实施例,光波导传感器芯片包括光波导层; 一对光学元件,设置在光波导层的两端,使得光进入光波导层,光从光波导层出射; 形成在光波导层的预定区域上的功能膜; 覆盖层,形成在所述光波导层的光入射面的平面区域中,至少设置有所述光学元件; 第一通孔,被配置为允许进入入射侧光学元件的光通过; 以及第二通孔,其构造成允许从出射侧光学元件射出的光通过。

    OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS USED FOR THE SAME
    2.
    发明申请
    OPTICAL INSPECTION METHOD AND OPTICAL INSPECTION APPARATUS USED FOR THE SAME 审中-公开
    光学检测方法和光学检测装置

    公开(公告)号:US20070146718A1

    公开(公告)日:2007-06-28

    申请号:US11565897

    申请日:2006-12-01

    IPC分类号: G01N21/55

    摘要: An inspection method using a portable optical inspection apparatus adapted to be driven by a battery and capable of producing an accurate sensing result without being adversely affected by the environmental temperature conditions is disclosed. The light is radiated on a sensor chip for a predetermined length of time and the amount of a substance contained in a specimen placed on a sensing thin film is measured by an optical signal obtained from the sensing chip, using an optical inspection apparatus comprising the sensor chip including a substrate 5, an optical waveguide layer 6 arranged on the substrate and the sensing thin film 7 attached on the surface of the optical waveguide layer, a light source 8 for radiating the light on the sensor chip and a photodetector 9 for receiving and converting the light output from the sensor chip into an electrical signal The light source is turned on and off a plurality of times for a predetermined length of time during which the inspection light is radiated. The amount of light with the light source on is measured by the photodetector thereby to determine the amount of the substance. In the process, the light amount with the light source off can also be measured so that the amount of the substance is determined from the difference between the light amount with the light source on and off.

    摘要翻译: 公开了一种使用便携式光学检查装置的检查方法,该便携式光学检查装置适于由电池驱动并且能够产生精确的感测结果而不受环境温度条件的不利影响。 将光照射在传感器芯片上预定的时间长度,并且通过使用包括传感器的光学检查装置的感测芯片获得的光学信号来测量放置在感测薄膜上的样本中所含有的物质的量 芯片,其包括基板5,布置在基板上的光波导层6和安装在光波导层的表面上的感测薄膜7,用于在传感器芯片上照射光的光源8和用于接收和 将来自传感器芯片的光输出转换为电信号。在其中辐射检查光的预定长度的时间内,光源被多次打开和关闭。 通过光电检测器测量光源的光量,从而确定物质的量。 在该过程中,也可以测量光源关闭的光量,使得物质的量由光源的光量的开启和关闭之间的差确定。