摘要:
Provided is an inspecting apparatus for inspecting a photovoltaic devices by applying a current to the photovoltaic devices in a forward direction to make the photovoltaic devices emit EL light which is simple in structure and capable of shortening inspection time in inspecting a defect from a photographed image with a perfect resolution. The inspecting apparatus includes a darkroom (110) provided with an upper surface (111) having an opening portion (112), a support device provided at the upper surface of the darkroom (110) to support the photovoltaic devices as an inspecting object (200) on the opening portion (112), cameras (121, 122 and 123) disposed inside the darkroom (110) for photographing the inspecting object (200), and a moving device configured to move the cameras in the darkroom (110). The moving device includes an x-axial guiding portion (140), a motor (142) and a timing belt (144).
摘要:
The present invention provides an inspection apparatus for photovoltaic devices which electrifies the photovoltaic devices in a forward direction thereof to make the photovoltaic devices emit electro-luminescence light and which has a simple-structured and cheap darkroom. The inspecting apparatus of the present invention includes a darkroom (110) provided with a flat upper surface (111), a transparent plate (112) which is provided in the upper surface of the darkroom for disposing the photovoltaic devices as an inspecting object (200), a reflector (140) which is disposed in the darkroom (110) at an oblique angle to the transparent plate, and a shading member for covering a camera (120) which is provided in the darkroom (110), the photovoltaic devices as the inspecting object on the darkroom and a guide member for transporting the photovoltaic devices.
摘要:
Provided is an inspecting apparatus for inspecting a photovoltaic devices by applying a current to the photovoltaic devices in a forward direction to make the photovoltaic devices emit EL light which is simple in structure and capable of shortening inspection time in inspecting a defect from a photographed image with a perfect resolution.The inspecting apparatus of the present invention includes a darkroom (110) provided with an upper surface (111) having an opening portion (112), a support means provided at the upper surface of the darkroom (110) to support the photovoltaic devices as an inspecting object (200) on the opening portion (112), a plurality of cameras (121, 122 and 123) disposed inside the darkroom (110) for photographing the inspecting object (200), and a moving means configured to move the cameras in the darkroom (110). The moving means includes an x-axial guiding portion (140), a motor (142) and a timing belt (144).
摘要:
To provide the solar simulator that facilitates making the flash light emitted from the lamp into the desirable irradiance waveform. In the solar simulator 1, the controller 12, according to the control pattern preset to maintain the flash light F emitted from the xenon lamp 14 at the target irradiance for a certain period of time, controls the electric current, which is discharged from the condenser assembly 26 and flowing through the xenon lamp 14, by performing the switching drive on the power switching element 20.
摘要:
A solar simulator for measuring the current-voltage characteristics of photovoltaic devices, in which an irradiated test plane of the object to be measured is disposed opposite an illuminating surface of the light source, the whole test plane of the photovoltaic devices is divided imaginarily into a plurality of sections, and a selected member for adjusting irradiance is disposed opposite the test plane of each imaginary sections so as to equalize or substantially to equalize the irradiance by the light source at every irradiated test plane of the sections, after which light from the light source is directed onto the test plane of the object to be measured.
摘要:
To provide the solar simulator that facilitates making the flash light emitted from the lamp into the desirable irradiance waveform. In the solar simulator 1, the controller 12, according to the control pattern preset to maintain the flash light F emitted from the xenon lamp 14 at the target irradiance for a certain period of time, controls the electric current, which is discharged from the condenser assembly 26 and flowing through the xenon lamp 14, by performing the switching drive on the power switching element 20.
摘要:
The present invention provides a solar simulator that measures characteristics of multi junction photovoltaic devices for a short time, and a measuring method of a multi-junction photovoltaic devices using the simulator.The measurement method of the multi junction photovoltaic devices of the present invention includes the following processes: the process that the halogen lamp 13 emits a flash light and a top of a light pulse wave shape is controlled to be flat; the process that the xenon lamp 14 once or plural times emits a flash light which has the flat top and is shorter pulse than the flat area of the halogen lamp flash light while the top of a light pulse shape of the flash light from the halogen lamp is flat; and the process that the flash lights from the halogen lamp and the xenon lamp is irradiated to the photovoltaic devices 20 as the measurement object, and during the emission of the flash light from the xenon lamp, the load of the photovoltaic devices is controlled and the current and the voltage generating therefrom are measured at a single point or plural points.
摘要:
In a solar simulator for measuring the current-voltage characteristics of photovoltaic devices, it is to provide a measurement method using a solar simulator in which locative unevenness of irradiance on the test plane of the test plane side is drastically improved, not in a light source side, and a means for adjusting irradiance and the like. when an object is the photovoltaic devices Ms, and the current-voltage characteristics are measured by a solar simulator Ss equipped with a light source composed of a lamp and a reflector, and a part for setting the object to be measured, in which it is possible to dispose an irradiated test plane of the object to be measured opposite an illuminating surface of said light source, the whole test plane of said photovoltaic devices is divided imaginarily into a plurality of sections and a selected member for adjusting irradiance is disposed opposite the test plane of each imaginary sections so as to equalize or substantially to equalize the irradiance by the light source at every irradiated test plane of the sections, after which light from said light source is directed onto the test plane of the object to be measured.
摘要:
[Problem] In a solar simulator for measuring the current-voltage characteristics of photovoltaic devices, it is to provide a measurement method using a solar simulator in which locative unevenness of irradiance on the test plane of the test plane side is drastically improved, not in a light source side, and a means for adjusting irradiance and the like.[Solving Means] when an object is the photovoltaic devices Ms, and the current-voltage characteristics are measured by a solar simulator Ss equipped with a light source composed of a lamp and a reflector, and a part for setting the object to be measured, in which it is possible to dispose an irradiated test plane of the object to be measured opposite an illuminating surface of said light source, the whole test plane of said photovoltaic devices is divided imaginarily into a plurality of sections and a selected member for adjusting irradiance is disposed opposite the test plane of each imaginary sections so as to equalize or substantially to equalize the irradiance by the light source at every irradiated test plane of the sections, after which light from said light source is directed onto the test plane of the object to be measured.
摘要:
In a solar simulator for measuring the current-voltage characteristics of photovoltaic devices, it is to provide a measurement method using a solar simulator in which locative unevenness of irradiance on the test plane of the test plane side is drastically improved, not in a light source side, and a means for adjusting irradiance and the like.when an object is the photovoltaic devices Ms, and the current-voltage characteristics are measured by a solar simulator Ss equipped with a light source composed of a lamp and a reflector, and a part for setting the object to be measured, in which it is possible to dispose an irradiated test plane of the object to be measured opposite an illuminating surface of said light source, the whole test plane of said photovoltaic devices is divided imaginarily into a plurality of sections and a selected member for adjusting irradiance is disposed opposite the test plane of each imaginary sections so as to equalize or substantially to equalize the irradiance by the light source at every irradiated test plane of the sections, after which light from said light source is directed onto the test plane of the object to be measured.