公开(公告)号：US09188551B2

公开(公告)日：2015-11-17

申请号：US14033025

申请日：2013-09-20

Applicant: MORPHO DETECTION, INC.

Inventor： Geoffrey Harding ,  Helmut Rudolf Otto Strecker

IPC: G01N23/201 ,  G01N23/20 ,  G01V5/00

CPC classification number: G01N23/201 ,  G01N23/20 ,  G01N2223/3307 ,  G01N2223/643 ,  G01V5/0025

Abstract: An x-ray diffraction imaging (XDI) system having a system axis includes at least one x-ray source configured to generate x-rays directed toward an object that includes at least one substance. The at least one x-ray source is further configured to irradiate at least one voxel defined within the object with x-rays arriving from a plurality of directions, each direction defined by an angle of incidence with respect to the system axis. The system also includes at least one detector configured to detect scattered x-rays after the x-rays have passed through the object. The system further includes at least one processor coupled to the at least one detector. The processor is programmed to generate a plurality of XDI profiles of the object voxel. Each XDI profile is a function of an associated angle of incidence.

Abstract translation: 具有系统轴的x射线衍射成像（XDI）系统包括被配置为产生朝向包括至少一种物质的物体的x射线的至少一个x射线源。 所述至少一个X射线源还被配置成用从多个方向到达的x射线照射在物体内限定的至少一个体素，每个方向由相对于系统轴线的入射角限定。 该系统还包括至少一个检测器，其构造成在X射线已经通过物体之后检测散射的X射线。 系统还包括耦合到至少一个检测器的至少一个处理器。 处理器被编程为生成对象体素的多个XDI轮廓。 每个XDI轮廓是相关联的入射角的函数。

公开(公告)号：US20150085983A1

公开(公告)日：2015-03-26

申请号：US14033025

申请日：2013-09-20

Applicant: Morpho Detection, Inc.

Inventor： Geoffrey Harding ,  Helmut Rudolf Otto Strecker

IPC: G01N23/201 ,  G01V5/00

CPC classification number: G01N23/201 ,  G01N23/20 ,  G01N2223/3307 ,  G01N2223/643 ,  G01V5/0025

Abstract: An x-ray diffraction imaging (XDI) system having a system axis includes at least one x-ray source configured to generate x-rays directed toward an object that includes at least one substance. The at least one x-ray source is further configured to irradiate at least one voxel defined within the object with x-rays arriving from a plurality of directions, each direction defined by an angle of incidence with respect to the system axis. The system also includes at least one detector configured to detect scattered x-rays after the x-rays have passed through the object. The system further includes at least one processor coupled to the at least one detector. The processor is programmed to generate a plurality of XDI profiles of the object voxel. Each XDI profile is a function of an associated angle of incidence.

Abstract translation: 具有系统轴的x射线衍射成像（XDI）系统包括被配置为产生朝向包括至少一种物质的物体的x射线的至少一个x射线源。 所述至少一个X射线源还被配置成用从多个方向到达的x射线照射在物体内限定的至少一个体素，每个方向由相对于系统轴线的入射角限定。 该系统还包括至少一个检测器，其构造成在X射线已经通过物体之后检测散射的X射线。 系统还包括耦合到至少一个检测器的至少一个处理器。 处理器被编程为生成对象体素的多个XDI轮廓。 每个XDI轮廓是相关联的入射角的函数。