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公开(公告)号:US20240363330A1
公开(公告)日:2024-10-31
申请号:US18308664
申请日:2023-04-27
发明人: Szu Yu HOU
IPC分类号: H01L21/02 , H01L21/311 , H01L21/768 , H01L23/532
CPC分类号: H01L21/02068 , H01L21/31138 , H01L21/76814 , H01L23/53257
摘要: A semiconductor device includes a substrate and a bit line structure disposed on the substrate. The bit line structure includes a first conductive structure and a second conductive structure, in which a material of the first conductive structure includes polysilicon. The second conductive structure is disposed in direct contact on the first conductive structure, in which a reactivity of a material of the second conductive structure to oxygen is larger than a reactivity of tungsten to oxygen.