公开(公告)号：US20240012026A1

公开(公告)日：2024-01-11

申请号：US18267124

申请日：2021-11-11

Applicant: National Institute of Advanced Industrial Science and Technology

Inventor： Ryo Sakamaki ,  Masahiro Horibe

IPC: G01R1/067

CPC classification number: G01R1/06794 ,  G01R31/2822

Abstract: A determination method according to the present application includes: (A) a step for measuring, at a plurality of frequencies, an S-parameter at the current probe location or in the current coaxial connector or waveguide connection state; (B) a step for calculating a coefficient matrix for fitting a prescribed function matrix to the measured S-parameter frequency properties; (C) a step for calculating a first local outlier factor on the basis of the calculated coefficient matrix; and (D) a determination step for determining, on the basis of the relationship between a threshold and the calculated first local outlier factor, whether a first state in which the probe is contacting the prescribed target, or a second state in which there is a connection failure between the coaxial connector or the waveguide and the prescribed target exists.

公开(公告)号：US11796439B2

公开(公告)日：2023-10-24

申请号：US17155705

申请日：2021-01-22

Applicant: HIOKI E.E. CORPORATION ,  National Institute of Advanced Industrial Science and Technology

Inventor： Akihiro Shioiri ,  Naoto Nakayama ,  Yuki Kawamuro ,  Masahiro Horibe

IPC: G01N15/02

CPC classification number: G01N15/0266

Abstract: A uniformity output device for outputting a uniformity of particles in a slurry, in which an insoluble solid matter is mixed in liquid, includes: a pair of electrodes configured to apply AC voltage to the slurry; a measurement unit configured to measure impedance of the slurry on the basis of the response current flowing through the slurry when AC voltage with changing frequency is applied to the slurry; and a processing unit configured to determine the uniformity by executing a particle equivalent circuit analysis with a parallel circuit formed of a resistor and a capacitor as an element on the basis of the impedance measured by the measurement unit in accordance with the frequency.

公开(公告)号：US11152678B2

公开(公告)日：2021-10-19

申请号：US16610108

申请日：2018-05-18

Applicant: DAIKIN INDUSTRIES, LTD. ,  NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Hiroyuki Yoshimoto ,  Dai Fukami ,  Taku Yamanaka ,  Tomohiro Ikeda ,  Masahiro Horibe ,  Yuto Kato

IPC: H01P5/08 ,  H01P1/04 ,  H01P1/18 ,  H01P3/16

Abstract: The invention provides a connector-attached dielectric waveguide that allows the dielectric waveguide to be easily connectable with an opposite component and is capable of forming a connection structure exhibiting low transmission and return losses of a high frequency signal. The connector-attached dielectric waveguide includes a dielectric waveguide and a connector. The dielectric waveguide includes a dielectric waveguide body and a dielectric waveguide end. The dielectric waveguide end has a smaller cross-sectional area than the dielectric waveguide body.

公开(公告)号：US10944146B2

公开(公告)日：2021-03-09

申请号：US16338229

申请日：2017-09-29

Applicant: DAIKIN INDUSTRIES, LTD. ,  NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Hiroyuki Yoshimoto ,  Dai Fukami ,  Taku Yamanaka ,  Masahiro Horibe ,  Yuto Kato ,  Ryo Sakamaki

IPC: H01P3/16 ,  H01P11/00 ,  H01P5/08

Abstract: The invention provides a dielectric waveguide for transmitting millimeter waves or sub-millimeter waves. The dielectric waveguide is easily processed and connected even when having a small diameter, and can provide a connection structure exhibiting low transmission and return losses of high frequency signals. The dielectric waveguide includes a dielectric waveguide body and a dielectric waveguide end having a lower permittivity than the dielectric waveguide body. The dielectric waveguide body and the dielectric waveguide end are seamlessly and monolithically formed from the same material.

公开(公告)号：US11131699B2

公开(公告)日：2021-09-28

申请号：US16641807

申请日：2018-09-07

Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Ryo Sakamaki ,  Masahiro Horibe

IPC: G01R27/06 ,  G01R1/067 ,  G01R31/28

Abstract: A method that includes changing a probe angle with respect to the conductor surface of a substrate that has a flat conductor surface mounted on the mounting surface of a stage in a high-frequency test system, thereby changing the state of contact of the tip of a signal terminal and tip of a ground terminal with the conductor surface, outputting high-frequency signals from the signal terminal to the conductor surface and receiving reflected signals using the probe to find S-parameters at different probe angles, and determining, based on a plurality of the S-parameters, a reference probe angle at which the reference line formed connecting the tip of the signal terminal and tip of the ground terminal is parallel with the conductor surface.