公开(公告)号：US11092651B2

公开(公告)日：2021-08-17

申请号：US16304895

申请日：2017-04-12

Applicant: National Institute of Advanced Industrial Science and Technology

Inventor： Ryo Sakamaki

IPC: G01R1/073 ,  G01R31/00 ,  G01R31/319 ,  G01R31/28

Abstract: A high-frequency characteristic inspection apparatus includes a pair of high-frequency probes that inspect an electrical characteristic of a plane circuit including a signal region and a ground region formed apart from each other by an S parameter obtained by pushing a tip against a surface of the plane circuit and discharging a high frequency and a measurement apparatus. The high-frequency probe includes a ground terminal that is in contact with the ground region at its tip and a signal terminal that is in contact with the signal region simultaneously with the ground terminal at its tip. The pair of high-frequency probes are configured to contact with a surface of the plane circuit at the same time while facing each other at a certain interval.

公开(公告)号：US20240012026A1

公开(公告)日：2024-01-11

申请号：US18267124

申请日：2021-11-11

Applicant: National Institute of Advanced Industrial Science and Technology

Inventor： Ryo Sakamaki ,  Masahiro Horibe

IPC: G01R1/067

CPC classification number: G01R1/06794 ,  G01R31/2822

Abstract: A determination method according to the present application includes: (A) a step for measuring, at a plurality of frequencies, an S-parameter at the current probe location or in the current coaxial connector or waveguide connection state; (B) a step for calculating a coefficient matrix for fitting a prescribed function matrix to the measured S-parameter frequency properties; (C) a step for calculating a first local outlier factor on the basis of the calculated coefficient matrix; and (D) a determination step for determining, on the basis of the relationship between a threshold and the calculated first local outlier factor, whether a first state in which the probe is contacting the prescribed target, or a second state in which there is a connection failure between the coaxial connector or the waveguide and the prescribed target exists.

公开(公告)号：US10944146B2

公开(公告)日：2021-03-09

申请号：US16338229

申请日：2017-09-29

Applicant: DAIKIN INDUSTRIES, LTD. ,  NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Hiroyuki Yoshimoto ,  Dai Fukami ,  Taku Yamanaka ,  Masahiro Horibe ,  Yuto Kato ,  Ryo Sakamaki

IPC: H01P3/16 ,  H01P11/00 ,  H01P5/08

Abstract: The invention provides a dielectric waveguide for transmitting millimeter waves or sub-millimeter waves. The dielectric waveguide is easily processed and connected even when having a small diameter, and can provide a connection structure exhibiting low transmission and return losses of high frequency signals. The dielectric waveguide includes a dielectric waveguide body and a dielectric waveguide end having a lower permittivity than the dielectric waveguide body. The dielectric waveguide body and the dielectric waveguide end are seamlessly and monolithically formed from the same material.

公开(公告)号：US11131699B2

公开(公告)日：2021-09-28

申请号：US16641807

申请日：2018-09-07

Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY

Inventor： Ryo Sakamaki ,  Masahiro Horibe

IPC: G01R27/06 ,  G01R1/067 ,  G01R31/28

Abstract: A method that includes changing a probe angle with respect to the conductor surface of a substrate that has a flat conductor surface mounted on the mounting surface of a stage in a high-frequency test system, thereby changing the state of contact of the tip of a signal terminal and tip of a ground terminal with the conductor surface, outputting high-frequency signals from the signal terminal to the conductor surface and receiving reflected signals using the probe to find S-parameters at different probe angles, and determining, based on a plurality of the S-parameters, a reference probe angle at which the reference line formed connecting the tip of the signal terminal and tip of the ground terminal is parallel with the conductor surface.