公开(公告)号：US20220178987A1

公开(公告)日：2022-06-09

申请号：US17601086

申请日：2020-03-27

Applicant: NIDEC READ CORPORATION

Inventor： Minoru KATO ,  Makoto FUJINO

IPC: G01R31/28 ,  G01R1/073 ,  G01R1/067

Abstract: In various examples, an inspection jig includes a plate-shaped insulating member having a recess; a first board having a first electrode; and a conducting wire electrically connected to a contact terminal. The insulating member is provided with a through hole penetrating a bottom portion of the recess. One end portion of the conducting wire is disposed in the through hole. The other end of the conducting wire is connected to the first electrode.

公开(公告)号：US20200018779A1

公开(公告)日：2020-01-16

申请号：US16504323

申请日：2019-07-07

Applicant: Nidec-Read Corporation ,  Nidec SV Probe Pte. Ltd.

Inventor： Minoru KATO ,  Tadakazu MIYATAKE ,  Akio HAYASHI ,  Masaki NAGANUMA ,  Matthias Joseph Chin Chieh Chia ,  Cheng Ghee Ong ,  Raminderjit Singh

IPC: G01R1/067 ,  G01R31/04 ,  G01R1/073

Abstract: A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.