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公开(公告)号:US10093351B2
公开(公告)日:2018-10-09
申请号:US15746682
申请日:2016-08-05
Applicant: NSK LTD.
Inventor: Shin Kumagai , Kyosho Uryu , Nobuhiko Ando
IPC: B62D5/04 , H02M7/5387 , H02M1/36 , H02P27/08
Abstract: An electronic control unit diagnoses a short failure of an inverter FETs and diagnoses whether the failure of the FET-short detecting section has occurred. The unit controls a motor through an inverter including a bridge having an upper-stage FETs and a lower-stage FETs via an MCU, having: an FET-short detecting section to detect a short failure of the upper-stage FETs and the lower-stage FETs based on respective connection point voltages of the upper-stage FETs and the lower-stage FETs; and a diagnostic function to detect a failure of the FET-short detecting section. The diagnostic function diagnoses the failure of the FET-short detecting section at start up and turns-OFF the upper-stage FETs and the lower-stage FETs when the failure is detected. The FET-short detecting section diagnoses the short failure of the upper-stage FETs and the lower-stage FETs when the failure of the FET-short detecting section is not detected.
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公开(公告)号:US10543869B2
公开(公告)日:2020-01-28
申请号:US16139664
申请日:2018-09-24
Applicant: NSK LTD.
Inventor: Shin Kumagai , Kyosho Uryu , Nobuhiko Ando
IPC: B62D5/04 , H02M1/32 , H03K17/082 , H02P29/024 , H02P27/06 , H02M1/36 , H02M7/5387 , H02P27/08 , B62D6/00 , H02M7/48 , G01R31/327
Abstract: An electronic control unit diagnoses a short failure of an inverter FETs and diagnoses whether the failure of the FET-short detecting section has occurred. The unit controls a motor through an inverter including a bridge having an upper-stage FETs and a lower-stage FETs via an MCU, having: an FET-short detecting section to detect a short failure of the upper-stage FETs and the lower-stage FETs based on respective connection point voltages of the upper-stage FETs and the lower-stage FETs; and a diagnostic function to detect a failure of the FET-short detecting section. The diagnostic function diagnoses the failure of the FET-short detecting section at start up and turns-OFF the upper-stage FETs and the lower-stage FETs when the failure is detected. The FET-short detecting section diagnoses the short failure of the upper-stage FETs and the lower-stage FETs when the failure of the FET-short detecting section is not detected.
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公开(公告)号:US10471984B2
公开(公告)日:2019-11-12
申请号:US15776907
申请日:2016-11-22
Applicant: NSK Ltd. , TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Inventor: Shin Kumagai , Nobuhiko Ando , Kyosho Uryu , Takahiro Yamazaki
IPC: B62D5/04 , H02P27/06 , H02M7/48 , B62D6/00 , G06F11/30 , H02M1/32 , H02M7/5387 , H02P29/024
Abstract: An electronic control unit where an external watch dog timer (WDT) can always normally detect an abnormality (a failure) to a micro controller unit (MCU) related to a built-in self-test (BIST) function and which can maintain safety of a system. The control unit includes an external WDT to detect an abnormality of the MCU, a reset circuit to reset the MCU when the external WDT detects the abnormality of the MCU, and an ON/OFF control section to turn a gate of the semiconductor switching device on or off in accordance with the external WDT. The inverter is stopped by turning the gate off via the ON/OFF control section when the external WDT is a disable state. When the abnormality of the MCU is not detected in an enable state, the inverter is driven by turning the gate on via the ON/OFF control section. When the abnormality of the MCU is detected, the inverter is stopped by turning the gate off via the ON/OFF control section and the MCU is reset by the reset circuit.
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公开(公告)号:US10457321B2
公开(公告)日:2019-10-29
申请号:US16139585
申请日:2018-09-24
Applicant: NSK LTD.
Inventor: Shin Kumagai , Kyosho Uryu , Nobuhiko Ando
IPC: B62D5/04 , H02P27/06 , H02M1/36 , H02M7/5387 , H02P27/08 , H02M1/32 , B62D6/00 , H02M7/48 , H03K17/082 , H02P29/024
Abstract: An electronic control unit diagnoses a short failure of an inverter FETs and diagnoses whether the failure of the FET-short detecting section has occurred. The unit controls a motor through an inverter including a bridge having an upper-stage FETs and a lower-stage FETs via an MCU, having: an FET-short detecting section to detect a short failure of the upper-stage FETs and the lower-stage FETs based on respective connection point voltages of the upper-stage FETs and the lower-stage FETs; and a diagnostic function to detect a failure of the FET-short detecting section. The diagnostic function diagnoses the failure of the FET-short detecting section at start up and turns-OFF the upper-stage FETs and the lower-stage FETs when the failure is detected. The FET-short detecting section diagnoses the short failure of the upper-stage FETs and the lower-stage FETs when the failure of the FET-short detecting section is not detected.
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公开(公告)号:US10377413B2
公开(公告)日:2019-08-13
申请号:US16139635
申请日:2018-09-24
Applicant: NSK LTD.
Inventor: Shin Kumagai , Kyosho Uryu , Nobuhiko Ando
IPC: B62D5/04 , B62D6/00 , H02M1/32 , H02M1/36 , H02M7/48 , H02P27/06 , H02P27/08 , G01R31/327 , H02M7/5387 , H02P29/024 , H03K17/082
Abstract: An electronic control unit diagnoses a short failure of an inverter FETs and diagnoses whether the failure of the FET-short detecting section has occurred. The unit controls a motor through an inverter including a bridge having an upper-stage FETs and a lower-stage FETs via an MCU, having: an FET-short detecting section to detect a short failure of the upper-stage FETs and the lower-stage FETs based on respective connection point voltages of the upper-stage FETs and the lower-stage FETs; and a diagnostic function to detect a failure of the FET-short detecting section. The diagnostic function diagnoses the failure of the FET-short detecting section at start up and turns-OFF the upper-stage FETs and the lower-stage FETs when the failure is detected. The FET-short detecting section diagnoses the short failure of the upper-stage FETs and the lower-stage FETs when the failure of the FET-short detecting section is not detected.
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