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公开(公告)号:US11777483B1
公开(公告)日:2023-10-03
申请号:US17698867
申请日:2022-03-18
Applicant: NVIDIA CORPORATION
Inventor: Nishit Harshad Shah , Ting Ku , Krishnamraju Kurra , Gunaseelan Ponnuvel , Tezaswi Raja , Suhas Satheesh
Abstract: In various embodiments, a comparison circuit compares voltages within an integrated circuit. The comparison circuit includes a comparison capacitor, an inverter, and multiple switches. A first terminal of the comparison capacitor is coupled to both a first terminal of a first switch and a first terminal of a second switch. A second terminal of the comparison capacitor is coupled to both a first terminal of a third switch and an input of the inverter. An output of the inverter is coupled to both a second terminal of the third switch and a first terminal of a fourth switch. A second terminal of the fourth switch is coupled to a first terminal of a fifth switch and a first output of the comparison circuit. At least a portion of the switches are turned on during a comparison model and are turned off during a reset mode.
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公开(公告)号:US11619661B1
公开(公告)日:2023-04-04
申请号:US17698879
申请日:2022-03-18
Applicant: NVIDIA CORPORATION
Inventor: Nishit Harshad Shah , Ting Ku , Krishnamraju Kurra , Gunaseelan Ponnuvel , Tezaswi Raja , Suhas Satheesh
IPC: G01R19/165 , G01R19/00 , G06F1/04 , H03K19/20
Abstract: In various embodiments, a current measurement circuit measures an input current within an integrated circuit. The current measurement circuit includes an integration capacitor, an operational amplifier, a comparison capacitor, an inverter, and multiple switches. The current measurement circuit is coupled to a clocking circuit that, during operation, generates a two-phase clock having a frequency that is proportional to the input current. At least a portion of the switches are turned on during a first phase of the two-phase clock and are turned off during a second phase of the two-phase clock.
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