Abstract:
In various embodiments, a current measurement circuit measures an input current within an integrated circuit. The current measurement circuit includes an integration capacitor, an operational amplifier, a comparison capacitor, an inverter, and multiple switches. The current measurement circuit is coupled to a clocking circuit that, during operation, generates a two-phase clock having a frequency that is proportional to the input current. At least a portion of the switches are turned on during a first phase of the two-phase clock and are turned off during a second phase of the two-phase clock.
Abstract:
Aspects of the present invention are directed to techniques for improving the efficiency of power supply schemes by continuously and adaptively scaling voltage and frequency levels in an integrated circuit based on measured conditions in real-time, without resorting to a reliance on excessive pre-computed margins typical of conventional schemes. Embodiments of the present invention employ a self-tuning dynamic voltage control oscillator (or other similar clock signal generator) that sets the frequency for components in the integrated circuit. When a requested frequency exceeds a maximum allowed frequency for a given voltage level (accounting for other age and temperature related conditions), a look-up table is dynamically referenced to determine a new voltage level that is sufficient to safely and efficiently generate the requested frequency. The look-up table continuously receives updates on the operating conditions, and new voltage requests can be generated dynamically as necessary based on the system's current needs.
Abstract:
One embodiment provides a method for reducing leakage current in device logic having an operational supply-voltage threshold, a nonzero data-retention supply-voltage threshold, and two or more on-die transistor switches to switchably connect a voltage source to the device logic. After the logic enters an idle period, one or more of the switches are opened to lower a supply voltage of the logic below the operational supply-voltage threshold but above the data-retention supply-voltage threshold. When the logic exits the idle period, one or more of the switches are closed to raise the supply voltage of the logic above the operational supply-voltage threshold.
Abstract:
A degradation detector for an integrated circuit (IC), a method of detecting aging in an IC and an IC incorporating the degradation detector or the method. In one embodiment, the degradation detector includes: (1) an offline ring oscillator (RO) coupled to a power gate and a clock gate, (2) a frozen RO coupled to a clock gate, (3) an online RO and (4) an analyzer coupled to the offline RO, the frozen RO and the online RO and operable to place the degradation detector in a normal state in which the offline RO is disconnected from both the drive voltage source and the clock source, the frozen RO is connected to the drive voltage source but disconnected from the clock source and the online RO is connected to both the drive voltage source and the clock source.
Abstract:
A system and method are provided for regulating a supply voltage of a device. The method includes the steps of determining whether a supply voltage for an analog multiplexor is below a threshold voltage. If the supply voltage for the analog multiplexor is below the threshold voltage, then the method includes the step of shorting the supply voltage to an output of the analog multiplexor. However, if the supply voltage for the analog multiplexor is above or equal to the threshold voltage, then the method includes the step of transmitting at least one input signal coupled to the analog multiplexor to the output of the analog multiplexor. A system configured to implement the method may include a power management integrated circuit configured to generate a supply voltage for a device and a device that includes a self-powered analog multiplexor with voltage sensing bypass switch.
Abstract:
Circuitry and method of operating a circuit for monitoring a clock signal having phase-to-phase variation is disclosed. The method comprises adding a fixed number of bits to a pulse count of a reference phase instance for a high or low phase to yield a modified added pulse count when detecting a clock slow abnormality, subtracting the fixed number of bits from the pulse count of the reference phase instance to yield a modified subtracted pulse count when detecting a clock fast abnormality, comparing the modified added pulse count to a pulse count for an immediately subsequent phase instance of the high or low phase count of the clock signal when detecting the clock slow abnormality, and comparing the modified subtracted pulse count to the pulse count for the immediately subsequent phase instance of the high phase or low phase count of the clock signal when detecting the clock fast abnormality.
Abstract:
In various embodiments, a comparison circuit compares voltages within an integrated circuit. The comparison circuit includes a comparison capacitor, an inverter, and multiple switches. A first terminal of the comparison capacitor is coupled to both a first terminal of a first switch and a first terminal of a second switch. A second terminal of the comparison capacitor is coupled to both a first terminal of a third switch and an input of the inverter. An output of the inverter is coupled to both a second terminal of the third switch and a first terminal of a fourth switch. A second terminal of the fourth switch is coupled to a first terminal of a fifth switch and a first output of the comparison circuit. At least a portion of the switches are turned on during a comparison model and are turned off during a reset mode.
Abstract:
Introduced herein is an improved technique of recovering system frequency margin via distributed CPMs. The introduced technique creates and distributes multiple sets of always sensitized critical path replicas across a chip and monitors them for timing failure. The introduced technique takes feedback from these critical path replicas and dynamically boosts the clock frequency of the chip to remove the margin. The introduced technique provides more accurate and more comprehensive coverage of a chip performance.
Abstract:
A method for regulating voltage for a processor is disclosed. The method comprises requesting a target frequency value, wherein the target frequency value determines a target clock frequency for clocking the processor. The method also comprises comparing the target clock frequency to a first signal to generate an error signal. Further, the method comprises using the error signal to generate a duty cycle control signal, wherein the duty cycle control signal is operable to generate a periodic waveform. Finally, the method comprises generating an output regulator voltage using the periodic waveform, wherein the output voltage is operable to provide power to the processor.
Abstract:
Presented systems and methods can facilitate efficient voltage sensing and regulation. In one embodiment, a presented multiple point voltage sensing system includes Multiple point voltage sensing. Multi-point sensing is the scheme where voltage feedback from Silicon to the voltage regulator is an average from multiple points on the die. In one embodiment, multi-point sensing is done by placing multiple sense points across the partition/silicon and merging the sense traces from each sense point with balanced routing. In one embodiment, a presented multiple point voltage sensing system includes Virtual VDD Sensing with guaranteed non-floating feedback. In one exemplary implementation, Virtual VDD Sensing with guaranteed non-floating feedback allows more accurate sensing when a component is power gated off by removing the sensing results associated with the component.