Leakage compensation circuit for a capacitive or resistive measurement device

    公开(公告)号:US11340639B2

    公开(公告)日:2022-05-24

    申请号:US17089871

    申请日:2020-11-05

    申请人: NXP B.V.

    摘要: It is described a leakage compensation circuit for a measurement device which comprises a measurement circuit with a leaking device that is connected to a measurement path and causes a leakage current. The leakage compensation circuit comprises: i) a replica device of the leaking device, wherein the replica device is connected to a replica path, and wherein the replica device is configured to cause a replica leakage current that is essentially equal to the leakage current of the leaking device, ii) a voltage regulator which is connected to the measurement path and to the replica path, wherein the voltage regulator is configured to regulate the voltage in the replica path based on the voltage of the measurement path, and iii) a current mirror which is connected to the measurement path and to the replica path, wherein the current mirror is configured to mirror the replica leakage current of the replica device into the measurement path.

    STORAGE DEVICE AND METHOD OF PRODUCING THE SAME

    公开(公告)号:US20230004770A1

    公开(公告)日:2023-01-05

    申请号:US17808125

    申请日:2022-06-22

    申请人: NXP B.V.

    IPC分类号: G06K19/07

    摘要: In accordance with a first aspect of the present disclosure, a storage device is provided, comprising: a capacitor configured to be charged; a charge circuit configured to charge said capacitor; a pass device coupled between the charge circuit and the capacitor; a control circuit configured to control said pass device; a photosensitive diode coupled between the control circuit and the pass device, such that an input voltage provided by the control circuit to the pass device is reduced if the storage device is exposed to light. In accordance with a second aspect of the present disclosure, a corresponding method of producing a storage device is conceived.

    LEAKAGE COMPENSATION CIRCUIT FOR A CAPACITIVE OR RESISTIVE MEASUREMENT DEVICE

    公开(公告)号:US20210173418A1

    公开(公告)日:2021-06-10

    申请号:US17089871

    申请日:2020-11-05

    申请人: NXP B.V.

    摘要: It is described a leakage compensation circuit for a measurement device which comprises a measurement circuit with a leaking device that is connected to a measurement path and causes a leakage current. The leakage compensation circuit comprises: i) a replica device of the leaking device, wherein the replica device is connected to a replica path, and wherein the replica device is configured to cause a replica leakage current that is essentially equal to the leakage current of the leaking device, ii) a voltage regulator which is connected to the measurement path and to the replica path, wherein the voltage regulator is configured to regulate the voltage in the replica path based on the voltage of the measurement path, and iii) a current mirror which is connected to the measurement path and to the replica path, wherein the current mirror is configured to mirror the replica leakage current of the replica device into the measurement path.

    Storage device and method of producing the same

    公开(公告)号:US11922244B2

    公开(公告)日:2024-03-05

    申请号:US17808125

    申请日:2022-06-22

    申请人: NXP B.V.

    IPC分类号: G06K19/07

    CPC分类号: G06K19/0715

    摘要: In accordance with a first aspect of the present disclosure, a storage device is provided, comprising: a capacitor configured to be charged; a charge circuit configured to charge said capacitor; a pass device coupled between the charge circuit and the capacitor; a control circuit configured to control said pass device; a photosensitive diode coupled between the control circuit and the pass device, such that an input voltage provided by the control circuit to the pass device is reduced if the storage device is exposed to light. In accordance with a second aspect of the present disclosure, a corresponding method of producing a storage device is conceived.