公开(公告)号：US20200072900A1

公开(公告)日：2020-03-05

申请号：US16117317

申请日：2018-08-30

Applicant: NXP B.V.

Inventor： Jan-Peter Schat ,  Xiankun Jin ,  Tao Chen

IPC: G01R31/3163 ,  H03M1/10 ,  G01R35/00

Abstract: An example analog-test-bus (ATB) apparatus includes a plurality of comparator circuits, each having an output port, and a pair of input ports of opposing polarity including an inverting port and a non-inverting port, a plurality of circuit nodes to be selectively connected to the input ports of a first polarity, and at least one digital-to-analog converter (DAC) to drive the input ports of the plurality of comparator circuits. The apparatus further includes data storage and logic circuitry that accounts for inaccuracies attributable to the plurality of comparator circuits by providing, for each comparator circuit, a set of calibration data indicative of the inaccuracies for adjusting comparison operations performed by the plurality of comparator circuits.