公开(公告)号：US07986481B2

公开(公告)日：2011-07-26

申请号：US11835927

申请日：2007-08-08

申请人： Noboru Yamanaka ,  Susumu Nagatsuka ,  Yoshihiro Kudo ,  Eric Cheuk Wing Leung ,  Chris Chiu Ming Leung ,  Leo Wai Kay Lau ,  Charles Kin Chiu Wong

发明人： Noboru Yamanaka ,  Susumu Nagatsuka ,  Yoshihiro Kudo ,  Eric Cheuk Wing Leung ,  Chris Chiu Ming Leung ,  Leo Wai Kay Lau ,  Charles Kin Chiu Wong

IPC分类号： G11B5/02

CPC分类号： G11B5/40 ,  G11B5/02 ,  G11B5/3967 ,  G11B5/6064 ,  G11B5/607 ,  G11B2005/0005

摘要： Provided is a magnetic reproducing method that enables a thin-film magnetic head including a head element for reading data signals which has a noise in its output due to a low temperature to bring out an excellent read characteristic in which the noise is suppressed even under the use environment with the low temperature. The magnetic reproducing method comprises the steps of: heating a head element for reading data signals which has a noise in its output due to a low temperature; and performing a read operation by using the head element for reading data signals under condition that the head element is increased in temperature.

摘要翻译： 提供了一种磁性再现方法，其能够实现包括用于读取由于低温而在其输出中具有噪声的数据信号的头元件的薄膜磁头，以产生甚至在 使用环境温度低。 磁再现方法包括以下步骤：加热用于读取由于低温而在其输出中具有噪声的数据信号的头元件; 并且在头元件温度升高的条件下，通过使用用于读取数据信号的头元件执行读取操作。

公开(公告)号：US07872471B2

公开(公告)日：2011-01-18

申请号：US11835049

申请日：2007-08-07

申请人： Noboru Yamanaka ,  Soji Koide ,  Yoshiyuki Mizoguchi ,  Eric Cheuk Wing Leung ,  Chris Chiu Ming Leung ,  Leo Wai Kay Lau ,  Charles Kin Chiu Wong

发明人： Noboru Yamanaka ,  Soji Koide ,  Yoshiyuki Mizoguchi ,  Eric Cheuk Wing Leung ,  Chris Chiu Ming Leung ,  Leo Wai Kay Lau ,  Charles Kin Chiu Wong

IPC分类号： G01R33/12 ,  G01R33/09

CPC分类号： G01R33/1207 ,  G11B5/3136 ,  G11B5/314 ,  G11B5/3173 ,  G11B5/3967 ,  G11B5/455 ,  G11B5/6011 ,  G11B5/6064 ,  Y10T29/49004

摘要： Provided is a method for testing a head element that enables proper evaluation of the head element based on a characteristic of the head element under high-temperature and high-stress conditions. The testing method can be performed on a thin-film magnetic head including a head element and a heating element capable of applying a heat and stress to the head element, or performed on a row bar or a substrate wafer on which a plurality of the head elements and a plurality of the heating elements are disposed. The testing method comprises the steps of: causing the heating element to generate heat to apply a heat and stress to the head element; and measuring a characteristic of the head element under the heat and stress to evaluate the head element.

摘要翻译： 提供了一种用于测试头元件的方法，该头元件能够在高温和高应力条件下基于头元件的特性来适当地评估头元件。 该测试方法可以在包括头元件和能够对头元件施加热和应力的加热元件的薄膜磁头上执行，或者在行棒或基板晶片上执行，其中多个头 元件和多个加热元件。 测试方法包括以下步骤：使加热元件产生热量以向头元件施加热量和应力; 并测量头部元件在热和应力下的特性以评估头部元件。