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公开(公告)号:US20220036527A1
公开(公告)日:2022-02-03
申请号:US16944165
申请日:2020-07-31
Applicant: Novatek Microelectronics Corp.
Inventor: Chih-Yu Chu , Po-Yuan Hsieh , Chieh-En Lee , Chung-Hao Tien , Shih-Hsuan Chen
Abstract: A method and an image processing device for mura detection on a display are proposed. The method includes the following steps. An original image of the display is received and segmented into region of interest (ROI) patches. A predetermined range of spatial frequency components are filtered out from the ROI patches to generate filtered ROI patches. A mura defect is identified from the display according to the filtered ROI patches and predetermined mura patterns.
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公开(公告)号:US20250014507A1
公开(公告)日:2025-01-09
申请号:US18642813
申请日:2024-04-22
Applicant: Novatek Microelectronics Corp.
Inventor: Wen-Lung Hung , Yu-Yi Chien , Po-Yuan Hsieh
Abstract: A display apparatus includes a display screen and a driver circuit. The display screen includes a plurality of light boxes. Each of the light boxes includes a plurality of light panels. Each of the light panels includes a plurality of display pixels. The driver circuit is coupled to the display screen. The driver circuit is configured to drives the display screen to display an image. The driver circuit performs a first compensation operation on the display screen according to a first compensation data, and the first compensation data is calculated on the basis of the light panels. The driver circuit performs a second compensation operation on the display screen according to a second compensation data, and the second compensation data is calculated on the basis of the display pixels.
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公开(公告)号:US20240331185A1
公开(公告)日:2024-10-03
申请号:US18129089
申请日:2023-03-31
Applicant: NOVATEK Microelectronics Corp.
Inventor: Yu-Yi Chien , Shih-Hsuan Chen , Wen-Lung Hung , Po-Yuan Hsieh
CPC classification number: G06T7/70 , G01J3/506 , G06T5/20 , G06T7/90 , G06T2207/10024 , G06T2207/20081 , G06T2207/20084
Abstract: A method of obtaining brightness information of a display panel having a plurality of pixels includes steps of: obtaining positioning information indicating positions of the plurality of pixels on a test picture; lighting up the plurality of pixels and capturing the test picture; measuring the plurality of pixels according to the positioning information, to obtain a light intensity distribution of each of the plurality of pixels in the test picture; and calculating the brightness information of each of the plurality of pixels according to the light intensity distribution.
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公开(公告)号:US11694608B1
公开(公告)日:2023-07-04
申请号:US17657634
申请日:2022-04-01
Applicant: NOVATEK Microelectronics Corp.
Inventor: Po-Yuan Hsieh , Yu-Yi Chien , Wen-Lung Hung
IPC: G09G3/32 , G09G3/3233 , G09G3/3291
CPC classification number: G09G3/32 , G09G3/3233 , G09G3/3291 , G09G2300/026 , G09G2320/0233 , G09G2320/0626 , G09G2320/0693 , G09G2360/16
Abstract: A calibrating device includes a memory and a processor. The memory is configured to store at least one computer readable instruction. The processor is electrically coupled to the memory, and configured to access and execute the at least one computer readable instruction to: analyze an image of a target region which a seam between two LED panels disposed side by side is in, to obtain characteristic data associated with the seam; compare the characteristic data associated with the seam with a predetermined value to generate a comparison result; and adjust grayscale data of pixels which are arranged in two lines of the two LED panels and adjacent to the seam, based on the comparison result, for adjusting luminance-chromaticity of the pixels, wherein the two lines are in a first direction or a second direction, and the first direction is perpendicular to the second direction.
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公开(公告)号:US11676265B2
公开(公告)日:2023-06-13
申请号:US16944165
申请日:2020-07-31
Applicant: Novatek Microelectronics Corp.
Inventor: Chih-Yu Chu , Po-Yuan Hsieh , Chieh-En Lee , Chung-Hao Tien , Shih-Hsuan Chen
Abstract: A method and an image processing device for mura detection on a display are proposed. The method includes the following steps. An original image of the display is received and segmented into region of interest (ROI) patches. A predetermined range of spatial frequency components are filtered out from the ROI patches to generate filtered ROI patches. A mura defect is identified from the display according to the filtered ROI patches and predetermined mura patterns.
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