-
公开(公告)号:US20240053147A1
公开(公告)日:2024-02-15
申请号:US18549106
申请日:2022-03-01
Inventor: Olivier LE TRAON , Raphaël LEVY , Jean GUERARD , Thomas PERRIER
IPC: G01C19/5733
CPC classification number: G01C19/5733
Abstract: An inertial angular position sensor includes at least three identical resonators which are arranged symmetrically about a sensitive axis of the sensor, so that a rate gyro constructed from the sensor has an integrating operation. The sensor further includes a coupling element which connects a vibrating portion of each resonator to the vibrating portions of all other resonators of the sensor. Preferred configurations for the inertial angular position sensor allow obtaining integrating rate gyros with high sensitivity and low production cost.
-
2.
公开(公告)号:US20240133691A1
公开(公告)日:2024-04-25
申请号:US18546396
申请日:2022-03-03
Inventor: Olivier LE TRAON , Raphaël LEVY , Jean GUERARD , Thomas PERRIER
IPC: G01C19/5733 , G01L1/16 , G01L5/04
CPC classification number: G01C19/5733 , G01L1/162 , G01L5/042
Abstract: A resonator is suitable for reducing or suppressing a force transmitted by a vibrating portion of the resonator to a support part. To this end, the vibrating portion includes two extensions which are each meander shaped such that two segments of each extension have respective speed components that are oriented in opposite directions. Such a resonator, which is balanced, can advantageously be used within a rate gyro or a force sensor.
-
公开(公告)号:US20230112323A1
公开(公告)日:2023-04-13
申请号:US17914258
申请日:2021-03-08
Inventor: Raphael LEVY , Thomas PERRIER , Pierre LAVENUS , Jean GUERARD , Vincent GAUDINEAU
Abstract: An electrical field detector includes an electromechanical oscillator, part of which is included of a piezoelectric element, a frequency measuring device which is coupled to the oscillator so as to measure the oscillation frequency, and an electrical masking assembly. The electrical masking assembly is arranged close to the piezoelectric element so that, during an use of the detector, the piezoelectric element moves by vibrating relative to the electrical masking assembly. A variable part of the piezoelectric element is thus exposed to the electrical field to be measured. A change in the oscillating frequency then forms an electrical field measurement result.
-
-