公开(公告)号：US20190196166A1

公开(公告)日：2019-06-27

申请号：US16206075

申请日：2018-11-30

申请人： OLYMPUS CORPORATION ,  UNIVERSITY OF TSUKUBA

发明人： Yoshinori IKETAKI ,  Hideaki KANOU

IPC分类号： G02B21/16 ,  G01N21/64 ,  G02B21/08 ,  G02B21/02

CPC分类号： G02B21/16 ,  G01N21/636 ,  G01N21/6458 ,  G02B21/02 ,  G02B21/086

摘要： A super-resolution microscope includes an illuminator and a detector. The illuminator irradiates illumination beams of different wavelengths through an objective lens onto a sample while causing at least a portion of the illumination beams to overlap spatially and temporally. The detector detects a signal beam generated by the sample as a result of irradiation of the sample with the illumination beams. The illumination beams include a first illumination beam that induces a first nonlinear optical process with respect to the sample and a second illumination beam that induces a second nonlinear optical process that suppresses the first nonlinear optical process. The nonlinear susceptibility of the second nonlinear optical process is greater than the nonlinear susceptibility of the first nonlinear optical process.

公开(公告)号：US20180209905A1

公开(公告)日：2018-07-26

申请号：US15834230

申请日：2017-12-07

申请人： OLYMPUS CORPORATION ,  UNIVERSITY OF TSUKUBA

发明人： Yoshinori IKETAKI ,  Hideaki KANOU

IPC分类号： G01N21/63 ,  G02B21/00 ,  G02B6/42 ,  G02B27/58 ,  G01N21/65

CPC分类号： G01N21/636 ,  G01N21/65 ,  G01N2021/637 ,  G01N2021/653 ,  G01N2021/655 ,  G02B6/0006 ,  G02B6/06 ,  G02B6/4298 ,  G02B21/0032 ,  G02B21/0048 ,  G02B21/0076 ,  G02B21/14 ,  G02B27/58

摘要： A super-resolution microscope includes an illuminator that irradiates illumination beams of colors of different wavelengths through an objective lens onto a sample while causing the illumination beams to overlap at least spatially and a detector that detects a signal beam generated by the sample through irradiation with the illumination beams. As the illumination beams, the illuminator irradiates first and second illumination beams onto the sample from the same direction. The first illumination beam includes multiple wavelengths or monochromatic light for inducing a nonlinear optical effect in the sample. The second illumination beam has a different wavefront distribution on a converging surface of the objective lens or a different spatial distribution of an electrical field vector than the first illumination beam and suppresses induction of the nonlinear optical effect. The detector detects a signal beam generated by the sample as a result of the nonlinear optical effect.