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10 条记录 (耗时 0.065 秒)

    Method and apparatus for determining resistances in multiphase transformer using multiple injected currents in respective windings
    1.
    发明授权
    Method and apparatus for determining resistances in multiphase transformer using multiple injected currents in respective windings 有权

    公开(公告)号：US10884072B2

    公开(公告)日：2021-01-05

    申请号：US16303352

    申请日：2017-05-24

    申请人： Omicron electronics GmbH

    发明人： Dirk Flax ,  René Sapetschnig

    IPC分类号： G01R31/62 ,  G01R27/08 ,  G01R31/72

    摘要： A method (60) for determining resistances (R1, R2, R3, RN) on a voltage level of a multiphase transformer (10) comprising one winding (u, v, w; U, V, W) for each phase comprises injecting a particular first current into the particular winding (u, v, w; U, V, W); recording a particular first voltage caused by the injected first currents in the plurality of phases; injecting a particular second current into the particular winding (u, v, w; U, V, W), wherein the particular injected second current differs from the particular injected first current in at least one of the plurality of phases; recording a particular second voltage caused by the injected second currents in the plurality of phases, and determining the resistances (R1, R2, R3, RN) on the voltage level on the basis of the injected first and second currents and the recorded first and second voltages. An apparatus (70) for determining resistances (R1, R2, R3, RN) on a voltage level of a multiphase transformer (10) is also proposed.

    METHOD AND APPARATUSES FOR DETERMINING RESISTANCES IN MULTIPHASE TRANSFORMERS
    4.
    发明申请
    METHOD AND APPARATUSES FOR DETERMINING RESISTANCES IN MULTIPHASE TRANSFORMERS 审中-公开

    公开(公告)号：US20200025817A1

    公开(公告)日：2020-01-23

    申请号：US16303352

    申请日：2017-05-24

    申请人： Omicron electronics GmbH

    发明人： Dirk Flax ,  René Sapetschnig

    IPC分类号： G01R31/02 ,  G01R31/06 ,  G01R27/08

    摘要： A method (60) for determining resistances (R1, R2, R3, RN) on a voltage level of a multiphase transformer (10) comprising one winding (u, v, w; U, V, W) for each phase comprises injecting a particular first current into the particular winding (u, v, w; U, V, W); recording a particular first voltage caused by the injected first currents in the plurality of phases; injecting a particular second current into the particular winding (u, v, w; U, V, W), wherein the particular injected second current differs from the particular injected first current in at least one of the plurality of phases; recording a particular second voltage caused by the injected second currents in the plurality of phases, and determining the resistances (R1, R2, R3, RN) on the voltage level on the basis of the injected first and second currents and the recorded first and second voltages. An apparatus (70) for determining resistances (R1, R2, R3, RN) on a voltage level of a multiphase transformer (10) is also proposed.

    TRANSFORMER TESTING DEVICE, AND METHOD FOR TESTING A TRANSFORMER
    5.
    发明申请
    TRANSFORMER TESTING DEVICE, AND METHOD FOR TESTING A TRANSFORMER 审中-公开

    公开(公告)号：US20180003760A1

    公开(公告)日：2018-01-04

    申请号：US15543063

    申请日：2015-12-18

    申请人： OMICRON ELECTRONICS GMBH

    发明人： Dirk Flax ,  Markus Pütter

    IPC分类号： G01R31/02 ,  H02P13/00

    CPC分类号： G01R31/027 ,  H02P13/00

    摘要： A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33).

    Transformer testing device, and method for testing a transformer
    7.
    发明授权
    Transformer testing device, and method for testing a transformer 有权

    公开(公告)号：US10914778B2

    公开(公告)日：2021-02-09

    申请号：US15543063

    申请日：2015-12-18

    申请人： OMICRON ELECTRONICS GMBH

    发明人： Dirk Flax ,  Markus Pütter

    IPC分类号： G01R31/02 ,  H02P13/00

    摘要： A transformer testing device (10) comprises outputs (31-33) for detachably connecting the transformer testing device to windings of multiple phases of a transformer (50). The transformer testing device (10) further comprises a plurality of sources (21-23), each of which is designed to generate a test signal. The transformer testing device (10) also comprises a switching matrix (40) that is connected between the plurality of sources (21-23) and the outputs (31-33).