公开(公告)号：US20230057540A1

公开(公告)日：2023-02-23

申请号：US17800217

申请日：2021-02-04

Applicant: OMRON Corporation

Inventor： Kohei TANISUE ,  Yusuke IIDA ,  Norihiro TOMAGO

IPC: G01S17/04

Abstract: Provided are a photoelectric sensor and a threshold setting method. The photoelectric sensor is a photoelectric sensor detecting an object and includes a light reception part, an object determination part, and a setting part. The light reception part receives light to obtain a light reception amount. The object determination part determines presence/absence of the object based on the light reception amount and a threshold. The setting part sets the threshold based on the light reception amount during a period in which it has been determined that the object is present and the light reception amount during a period in which it has been determined that the object is absent.

公开(公告)号：US20210018528A1

公开(公告)日：2021-01-21

申请号：US17043641

申请日：2019-04-25

Applicant: OMRON Corporation

Inventor： Norihiro TOMAGO ,  Kiyoshi IMAI ,  Yusuke IIDA ,  Yusuke SHIBASAKI

IPC: G01P3/68 ,  B65G43/08

Abstract: The present invention provides a sensor system with which a change in the state of a workpiece which has occurred in a conveyance process can be detennined. The sensor system comprises: a plurality of sensors positioned along a line and measuring data indicating that a workpiece being conveyed upon the line has passed thereby; a plurality of slave units respectively connected to the plurality of sensors and acquiring the data measured by the plurality of sensors; and a master unit connected to the plurality of slave units. The master unit comprises: a storage part for storing the data in association with information which relates to the timing at which the data was measured; and a determination part for comparing the data transmitted from two or more of the plurality of slave units using the information which relates to the timing, and determining a change in the state of the workpiece.

公开(公告)号：US20220390925A1

公开(公告)日：2022-12-08

申请号：US17776236

申请日：2020-12-01

Applicant: OMRON Corporation

Inventor： Yusuke IIDA ,  Norihiro TOMAGO ,  Kohei TANISUE ,  Yutaka KATO ,  Masanori TAKAHASHI

IPC: G05B19/418 ,  G05B23/02

Abstract: The present invention can detect early an abnormality or signs of abnormality in a workpiece. A sensor system 1 is provided with: a first sensor 30a that measures a workpiece; a second sensor 30b that measures the workpiece in a relatively longer cycle than the first sensor 30a; and a master unit 10. The master unit 10 includes: an acquisition unit 11 that acquires data measured by the first sensor 30a and data measured by the second sensor 30b; and a generation unit 12 that generates learning data which is used for machine learning of a learning model and in which the acquired data of the first sensor 30a is regarded as input data and the acquired data of the second sensor 30b is regarded as label data indicating a property of the input data.

公开(公告)号：US20190101646A1

公开(公告)日：2019-04-04

申请号：US16005686

申请日：2018-06-12

Applicant: OMRON Corporation

Inventor： Norihiro TOMAGO ,  Tomonori KONDO ,  Shinya FURUKAWA

IPC: G01S17/08 ,  G01B11/02 ,  F21V8/00

Abstract: An optical sensor and an abnormality detection method therefor are provided. The optical sensor includes a light source device that generates light to be irradiated to an object; a light receiving part that receives a reflected light from the object; a branch part that fuses a first optical fiber optically coupled to the light source device and a second optical fiber optically coupled to the light receiving part to join with one end of a third optical fiber facing the object; and a processing part that determines whether junction abnormality occurs at a junction between the third optical fiber and the branch part based on whether an increment in a received light amount detected by the light receiving part with respect to a reference detection amount which is detected in a state of no reflection from the other end of the third optical fiber is within a predetermined range.

公开(公告)号：US20180216933A1

公开(公告)日：2018-08-02

申请号：US15795314

申请日：2017-10-27

Applicant: OMRON CORPORATION

Inventor： Kosuke SUGIYAMA ,  Norihiro TOMAGO ,  Takahiro SUGA ,  Hiroaki TAKIMASA ,  Kenichi MATOBA

IPC: G01C9/06 ,  B23Q17/24 ,  G05B19/402

Abstract: Provided is an inclination measuring device with excellent convenience.An inclination measuring device includes: an optical system (sensor head) configured to irradiate a measurement object with an irradiated light ray from a light source and receive a reflected light ray from a measurement surface; a light receiving unit including at least one spectroscope configured to separate the reflected light ray into wavelength components, and a detector in which a plurality of light receiving elements are disposed; a light guide including a plurality of cores; and a processor configured to calculate an inclination angle of the measurement surface based on reflected light rays with respect to a plurality of irradiated light rays with which a plurality of positions on the measurement surface are irradiated.