公开(公告)号：US20190219695A1

公开(公告)日：2019-07-18

申请号：US16162399

申请日：2018-10-17

Applicant: OMRON Corporation

Inventor： Yosuke KAJII ,  Kenichi MATOBA ,  Tomonori KONDO

IPC: G01S17/32 ,  G01S7/491 ,  G01C3/08

CPC classification number: G01S17/32 ,  G01B11/026 ,  G01B2210/50 ,  G01C3/08 ,  G01S7/4913

Abstract: An optical measurement device includes: a light source, which emits light; a light reception portion, which detects a light reception amount of reflected light reflected on a target; a measurement portion, which measures a distance from the optical measurement device to the target based on the light reception amount of the reflected light; and a detection portion, which detects a portion of the target in which a light reception amount per unit time of the reflected light is smaller than a threshold value.

公开(公告)号：US20190101375A1

公开(公告)日：2019-04-04

申请号：US16132499

申请日：2018-09-17

Applicant: OMRON Corporation

Inventor： Hisayasu MORINO ,  Jun TAKASHIMA ,  Takahiro OKUDA ,  Kenichi MATOBA ,  Hiroaki TAKIMASA

IPC: G01B11/02 ,  G01B11/255 ,  G01J3/02 ,  G01J3/10

Abstract: A confocal measurement device includes a light source that outputs white light, an optical coupler, a sensor head that applies light with a chromatic aberration caused therein to a measurement object, and a spectroscope that acquires reflected light which is reflected by the measurement object and measures a spectrum of the reflected light. The optical coupler is a filter type coupler or a spatial optical system type coupler that brings a first transmission waveform when light is transmitted from a first optical fiber cable to a second optical fiber cable and a second transmission waveform when light is transmitted from the second optical fiber cable to a third optical fiber cable close to each other.

公开(公告)号：US20170160130A1

公开(公告)日：2017-06-08

申请号：US15363286

申请日：2016-11-29

Applicant: OMRON Corporation

Inventor： Hisayasu MORINO ,  Jun TAKASHIMA ,  Kenichi MATOBA ,  Masayuki HAYAKAWA ,  Naoki FUJIWARA ,  Mariko MARUKAWA

IPC: G01J3/02 ,  G02B6/02 ,  G01B11/245 ,  G01J3/28 ,  G01J3/10

CPC classification number: G01J3/0218 ,  G01B11/0608 ,  G01B11/245 ,  G01B2210/50 ,  G01J3/10 ,  G01J3/2803 ,  G02B6/02042

Abstract: To improve light use efficiency and thereby achieve even higher sampling rates.An optical measurement device includes: a light source configured to emit illumination light including a plurality of wavelength components; an optical system configured to introduce an axial chromatic aberration into the illumination light from the light source and to receive reflection light reflecting from a measurement object where at least a portion of the measurement object lies along a line extending from the optical axis of the optical system; a spectrometer for separating the reflection light received at the optical system into wavelength components, and a detector including a plurality of light receiving elements arranged one-dimensionally to correspond to the dispersion direction of the spectrometer.

公开(公告)号：US20190094013A1

公开(公告)日：2019-03-28

申请号：US15893714

申请日：2018-02-12

Applicant: OMRON Corporation

Inventor： Tomonori KONDO ,  Yuta SUZUKI ,  Kenichi MATOBA ,  Yoshihiro KANETANI

IPC: G01B11/14 ,  G06F17/11

Abstract: A displacement measuring device capable of accurately measuring a distance to a measurement target surface is provided. The displacement measuring device includes a light projecting part generating light, a sensor head irradiating a measurement target with the light and receiving light of the irradiated light reflected by a measurement target surface of the measurement target, and a control part calculating a value indicating a distance to the measurement target surface on the basis of the light received by the sensor head. The control part processes the calculated value as the value indicating the distance to the measurement target surface on condition that the calculated value is included in a preset numerical range and resets the preset numerical range on the basis of the calculated value.

公开(公告)号：US20190094368A1

公开(公告)日：2019-03-28

申请号：US15893702

申请日：2018-02-12

Applicant: OMRON Corporation

Inventor： Tomonori KONDO ,  Yuta SUZUKI ,  Kenichi MATOBA

IPC: G01S17/46 ,  G01S7/481

CPC classification number: G01S17/46 ,  G01B11/06 ,  G01B11/0608 ,  G01B21/042 ,  G01B21/045 ,  G01B2210/50 ,  G01S7/4811

Abstract: A displacement measurement device and a measurement method are provided. A displacement measurement device includes a light projecting unit configured to generate a light beam; a sensor head configured to emit the light beam to a measurement target object and receive a light beam reflected at the measurement target surface within the emitted light beam; a storage unit configured to store a function using a distance between the sensor head and the measurement target surface as a variable; and a control unit configured to calculate the distance based on a wavelength of the light received by the sensor head. The control unit calculates a value of the function using a distance between the sensor head and the measurement target surface of the measurement target object as a value of the variable. The control unit corrects the calculated distance using the calculated value of the function.

公开(公告)号：US20180216933A1

公开(公告)日：2018-08-02

申请号：US15795314

申请日：2017-10-27

Applicant: OMRON CORPORATION

Inventor： Kosuke SUGIYAMA ,  Norihiro TOMAGO ,  Takahiro SUGA ,  Hiroaki TAKIMASA ,  Kenichi MATOBA

IPC: G01C9/06 ,  B23Q17/24 ,  G05B19/402

Abstract: Provided is an inclination measuring device with excellent convenience.An inclination measuring device includes: an optical system (sensor head) configured to irradiate a measurement object with an irradiated light ray from a light source and receive a reflected light ray from a measurement surface; a light receiving unit including at least one spectroscope configured to separate the reflected light ray into wavelength components, and a detector in which a plurality of light receiving elements are disposed; a light guide including a plurality of cores; and a processor configured to calculate an inclination angle of the measurement surface based on reflected light rays with respect to a plurality of irradiated light rays with which a plurality of positions on the measurement surface are irradiated.