公开(公告)号：US08012331B2

公开(公告)日：2011-09-06

申请号：US11876180

申请日：2007-10-22

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： C25D5/02

CPC分类号： G01R1/06744 ,  G01R1/06711 ,  G01R1/07307 ,  G01R1/07342 ,  G01R3/00

摘要： Disclosed herein are a probe and a method of making the same, and more particularly to a probe having a minute pitch, with which a probe card corresponding to arrangement of pads formed with a massed shape or other various shapes on a wafer is made, and a method of making the same. The probe having a prescribed thickness and formed in the shape of a flat plate. The probe comprises a body part bent at the middle thereof so that the body part is elastically tensioned or compressed when a tension force or a compression force is applied to the body part at the upper and lower ends thereof, a connection part integrally formed with the lower end of the body part, the connection part being fixed to a substrate, and a tip part integrally formed with the upper end of the body part, the tip part contacting a pad of an element.

摘要翻译： 本文公开了一种探针及其制造方法，更具体地说，涉及一种具有微小间距的探针，其中形成了与晶片上形成有组合形状或其它各种形状的焊盘布置对应的探针卡，以及 制作相同的方法。 探针具有规定的厚度并形成为平板状。 探头包括在其中间弯曲的主体部分，使得当在其上端和下端处对主体部分施加张力或压缩力时，主体部分被弹性张紧或压缩;与主体部分的上端和下端一体形成的连接部， 主体部分的下端，连接部分固定到基底，以及与主体部分的上端一体形成的尖端部分，尖端部分接触元件的垫。

公开(公告)号：US20080035487A1

公开(公告)日：2008-02-14

申请号：US11876180

申请日：2007-10-22

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： C25D5/00

CPC分类号： G01R1/06744 ,  G01R1/06711 ,  G01R1/07307 ,  G01R1/07342 ,  G01R3/00

摘要： Disclosed herein are a probe and a method of making the same, and more particularly to a probe having a minute pitch, with which a probe card corresponding to arrangement of pads formed with a massed shape or other various shapes on a wafer is made, and a method of making the same. The probe having a prescribed thickness and formed in the shape of a flat plate. The probe comprises a body part bent at the middle thereof so that the body part is elastically tensioned or compressed when a tension force or a compression force is applied to the body part at the upper and lower ends thereof, a connection part integrally formed with the lower end of the body part, the connection part being fixed to a substrate, and a tip part integrally formed with the upper end of the body part, the tip part contacting a pad of an element.

摘要翻译： 本文公开了一种探针及其制造方法，更具体地说，涉及一种具有微小间距的探针，其中形成了与晶片上形成有组合形状或其它各种形状的焊盘布置对应的探针卡，以及 制作相同的方法。 探针具有规定的厚度并形成为平板状。 探头包括在其中间弯曲的主体部分，使得当在其上端和下端处对主体部分施加张力或压缩力时，主体部分被弹性张紧或压缩;与主体部分的上端和下端一体形成的连接部， 主体部分的下端，连接部分固定到基底，以及与主体部分的上端一体形成的尖端部分，尖端部分接触元件的垫。

公开(公告)号：US07592565B2

公开(公告)日：2009-09-22

申请号：US10549418

申请日：2004-03-16

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： B23K26/00

CPC分类号： G01R3/00 ,  B23K26/0861 ,  G01R1/06711 ,  G01R1/07342 ,  G01R31/2887

摘要： Disclosed herein are a probe positioning and bonding device and a probe bonding method, and more particularly a probe positioning and bonding device used to fix probes to prescribed positions on a substrate so that a probe card used for semiconductor integrated circuit testing equipment is manufactured, and a probe bonding method using the same. The probe positioning and bonding device comprises a stage unit disposed on a working table, a microscope disposed above the stage unit while being supported by means of a first supporting member disposed on the working table, a probe fixing unit disposed above the stage unit and below the microscope while being supported by means of a second supporting member disposed on the working table, and a light source unit supported by means of a third supporting member disposed on the working table. The light source unit is disposed toward the upper part of the stage unit.

摘要翻译： 这里公开了探针定位和接合装置和探针接合方法，更具体地，涉及用于将探针固定到基板上的规定位置的探针定位和接合装置，从而制造用于半导体集成电路检测设备的探针卡，以及 使用其的探针接合方法。 探针定位和接合装置包括设置在工作台上的台单元，设置在平台单元上方的显微镜，同时由设置在工作台上的第一支撑构件支撑;探针固定单元，设置在平台单元上方和下方 显微镜同时由设置在工作台上的第二支撑构件支撑，以及由设置在工作台上的第三支撑构件支撑的光源单元。 光源单元朝向台单元的上部设置。

公开(公告)号：US07579855B2

公开(公告)日：2009-08-25

申请号：US11352658

申请日：2006-02-13

申请人： Oug-Ki Lee ,  Jung Hoon Lee ,  Seong Hoon Jeong

发明人： Oug-Ki Lee ,  Jung Hoon Lee ,  Seong Hoon Jeong

IPC分类号： G01R31/02

CPC分类号： G01R3/00 ,  G01R1/06727 ,  G01R1/06733 ,  G01R1/07342 ,  H05K3/4092

摘要： Disclosed is an electrical contact element used to test an electronic device. The electrical contact element has a beam portion and a tip portion attached to an end of the beam portion. In representative embodiments, a part of the beam portion is bent, e.g., such that the beam portion is zigzagged one or more times. A projection may be formed around a proximal end of the tip portion.

摘要翻译： 公开了用于测试电子设备的电接触元件。 电接触元件具有梁部分和附接到梁部分的端部的尖端部分。 在代表性的实施例中，梁部分的一部分被弯曲，例如使得梁部分曲折地一次或多次。 突起可以围绕尖端部分的近端形成。

公开(公告)号：US20060171425A1

公开(公告)日：2006-08-03

申请号：US10549335

申请日：2004-03-16

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： H01S3/00

CPC分类号： G01R1/06744 ,  G01R1/06711 ,  G01R1/07307 ,  G01R1/07342 ,  G01R3/00

摘要： Disclosed herein are a probe and a method of making the same, and more particularly to a probe having a minute pitch, with which a probe card corresponding to arrangement of pads formed with a massed shape or other various shapes on a wafer is made, and a method of making the same. The probe having a prescribed thickness and formed in the shape of a flat plate. The probe comprises a body part bent at the middle thereof so that the body part is elastically tensioned or compressed when a tension force or a compression force is applied to the body part at the upper and lower ends thereof, a connection part integrally formed with the lower end of the body part, the connection part being fixed to a substrate, and a tip part integrally formed with the upper end of the body part, the tip part contacting a pad of an element.

摘要翻译： 本文公开了一种探针及其制造方法，更具体地说，涉及一种具有微小间距的探针，其中形成了与晶片上形成有组合形状或其它各种形状的焊盘布置对应的探针卡，以及 制作相同的方法。 探针具有规定的厚度并形成为平板状。 探头包括在其中间弯曲的主体部分，使得当在其上端和下端处对主体部分施加张力或压缩力时，主体部分被弹性张紧或压缩;与主体部分的上端和下端一体形成的连接部， 主体部分的下端，连接部分固定到基底，以及与主体部分的上端一体形成的尖端部分，尖端部分接触元件的垫。

公开(公告)号：US20060169678A1

公开(公告)日：2006-08-03

申请号：US10549418

申请日：2004-03-16

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： B23K26/00 ,  B23K26/02

CPC分类号： G01R3/00 ,  B23K26/0861 ,  G01R1/06711 ,  G01R1/07342 ,  G01R31/2887

摘要： Disclosed herein are a probe positioning and bonding device and a probe bonding method, and more particularly a probe positioning and bonding device used to fix probes to prescribed positions on a substrate so that a probe card used for semiconductor integrated circuit testing equipment is manufactured, and a probe bonding method using the same. The probe positioning and bonding device comprises a stage unit disposed on a working table, a microscope disposed above the stage unit while being supported by means of a first supporting member disposed on the working table, a probe fixing unit disposed above the stage unit and below the microscope while being supported by means of a second supporting member disposed on the working table, and a light source unit supported by means of a third supporting member disposed on the working table. The light source unit is disposed toward the upper part of the stage unit.

公开(公告)号：US07285966B2

公开(公告)日：2007-10-23

申请号：US10549335

申请日：2004-03-16

申请人： Oug-Ki Lee ,  Jung-Hoon Lee

发明人： Oug-Ki Lee ,  Jung-Hoon Lee

IPC分类号： G01R31/02

CPC分类号： G01R1/06744 ,  G01R1/06711 ,  G01R1/07307 ,  G01R1/07342 ,  G01R3/00

摘要： Disclosed herein are a probe and a method of making the same, and more particularly to a probe having a minute pitch, with which a probe card corresponding to arrangement of pads formed with a massed shape or other various shapes on a wafer is made, and a method of making the same. The probe having a prescribed thickness and formed in the shape of a flat plate. The probe comprises a body part bent at the middle thereof so that the body part is elastically tensioned or compressed when a tension force or a compression force is applied to the body part at the upper and lower ends thereof, a connection part integrally formed with the lower end of the body part, the connection part being fixed to a substrate, and a tip part integrally formed with the upper end of the body part, the tip part contacting a pad of an element.

摘要翻译： 本文公开了一种探针及其制造方法，更具体地说，涉及一种具有微小间距的探针，其中形成了与晶片上形成有组合形状或其它各种形状的焊盘布置对应的探针卡，以及 制作相同的方法。 探针具有规定的厚度并形成为平板状。 探头包括在其中间弯曲的主体部分，使得当在其上端和下端处对主体部分施加张力或压缩力时，主体部分被弹性张紧或压缩;与主体部分的上端和下端一体形成的连接部， 主体部分的下端，连接部分固定到基底，以及与主体部分的上端一体形成的尖端部分，尖端部分接触元件的垫。

公开(公告)号：US20080157792A1

公开(公告)日：2008-07-03

申请号：US11908996

申请日：2006-03-20

申请人： Oug-Ki Lee

发明人： Oug-Ki Lee

IPC分类号： G01R1/067 ,  G01R31/02

CPC分类号： G01R1/07342 ,  G01R3/00 ,  Y10T29/49117

摘要： A probe card includes a first micro probe head (MPH), a second MPH, and needles. The first MPH includes first conductive traces into which a test signal for testing an object having outer terminals is inputted. The second MPH includes second conductive traces electrically connected to the first conductive traces, respectively, and arranged corresponding to the outer terminals. The second MPH is detachably combined with the first MPH. The needles are electrically connected to the second conductive traces, respectively, to make contact with the outer terminals, respectively. Thus, only the second MPH may be replaced with a new one in accordance with alterations to the object so that time and costs for manufacturing the probe card may be reduced.

摘要翻译： 探针卡包括第一微探头（MPH），第二MPH和针。 第一MPH包括输入用于测试具有外部端子的物体的测试信号的第一导电迹线。 第二MPH包括分别电连接到第一导电迹线并且对应于外部端子布置的第二导电迹线。 第二MPH与第一MPH可拆卸地组合。 针分别电连接到第二导电迹线以分别与外部端子接触。 因此，根据对象的改变，仅可以用新的MPH替换第二MPH，从而可以减少制造探针卡的时间和成本。

公开(公告)号：US07830162B2

公开(公告)日：2010-11-09

申请号：US11989940

申请日：2006-07-19

申请人： Oug-Ki Lee

发明人： Oug-Ki Lee

IPC分类号： G01R31/02

CPC分类号： G01R1/06733 ,  G01R1/06744 ,  G01R3/00

摘要： Disclosed is a vertical probe and methods of fabricating and bonding the same. The probe is comprised of a contactor equipped with two tips, a connector electrically linking with a measuring terminal of a measurement system, And a bump connecting the contactor to the connector and buffing physical stress to the contactor.

摘要翻译： 公开了一种垂直探针及其制造和粘合方法。 该探针由配备有两个尖端的接触器，与测量系统的测量端子电连接的连接器以及将接触器连接到连接器并将接触器的物理应力抛光的凸块组成。

公开(公告)号：US07319773B2

公开(公告)日：2008-01-15

申请号：US10524709

申请日：2003-03-19

申请人： Oug-Ki Lee ,  Joo-Bae Kim

发明人： Oug-Ki Lee ,  Joo-Bae Kim

IPC分类号： H04R25/00

CPC分类号： H04B1/385 ,  H04M1/03 ,  H04R9/066 ,  H04R25/606 ,  H04R2460/13 ,  H04R2499/11

摘要： The present invention relates to a subminiature bone conduction speaker by using a vibrating plate and a mobile phone having the subminiature bone conduction speaker. A subminiature bone conduction speaker using a vibrating plate according to the present invention comprises a body having a shape of a cylinder of which upper portion is opened; yoke which is disposed in a lower portion of the body and of which center has a protrusion; a ring type magnet which is formed on the edge of the yoke and apart from an end portion of the protrusion by a predetermined clearance; an upper plate which is formed on the magnet; a mastoid which is contacted to bone conduction of a user and by which vibration is transmitted to the user; an acoustic vibrating plate which is inserted at a lower side of the mastoid to cover the opening portion of the body and which is made of an elastic material; an auxiliary vibrating plate which is inserted under the acoustic vibrating plate which is inserted to the mastoid; a voice coil which is attached to the auxiliary vibrating plate and which is inserted between the end portion of the protrusion of the yoke and the ring type magnet; a front cap for fixing the acoustic vibrating plate on the body; and a electrical signal input unit for inputting an electric signal to the voice coil.

摘要翻译： 本发明涉及一种使用振动板和具有超小型骨传导扬声器的移动电话的超小型骨传导扬声器。 使用根据本发明的振动板的超小型骨传导扬声器包括具有上部打开的气缸的形状的主体; 轭体，其设置在主体的下部并且其中心具有突起; 形成在轭的边缘上并与突起的端部分开预定间隙的环形磁体; 形成在磁体上的上板; 与用户的骨传导接触并通过其将振动传递给使用者的乳突; 声学振动板，其插入在乳突的下侧以覆盖本体的开口部分并且由弹性材料制成; 辅助振动板，其插入到插入到乳突中的声振动板下; 音圈，其附接到辅助振动板，并且插入在轭的突起的端部和环形磁体之间; 用于将声振动板固定在主体上的前盖; 以及用于向音圈输入电信号的电信号输入单元。