METHOD OF ESTIMATING PHOTOVOLTAIC MODEL PARAMETERS AND DATA-BASED PHOTOVOLTAIC FAULT DETECTION AND DIAGNOSIS METHOD AND APPARATUS USING PHOTOVOLTAIC MODEL

    公开(公告)号:US20240213922A1

    公开(公告)日:2024-06-27

    申请号:US18089932

    申请日:2022-12-28

    CPC classification number: H02S50/10

    Abstract: Disclosed are a method of estimating PV model parameters and a method and an apparatus for data-based PV fault detection and diagnosis using a PV model. The method comprises: substituting five parameters of a PV current, a diode saturation current, a diode ideality factor, a series resistance, and a parallel resistance into an output equation of a single diode model for PV modeling of a PV module; computing an MAEP in an output by comparing power-voltage (P-V) curve values of the PV module obtained from the single diode model, which is a PV simulation model, and P-V curve values of the PV module, which is an actual PV module, when the voltage is zero, the open-circuit voltage, or a specific data value increased as much as a preset intensity; and selecting parameters representing a minimum MAEP among a plurality of stored MAEPs as parameters of the PV simulation model.

Patent Agency Ranking