公开(公告)号：US11681282B2

公开(公告)日：2023-06-20

申请号：US16845797

申请日：2020-04-10

申请人： Palantir Technologies, Inc.

发明人： Andrew Poh ,  Andre Frederico Cavalheiro Menck ,  Arion Sprague ,  Benjamin Grabham ,  Benjamin Lee ,  Bianca Rahill-Marier ,  Gregoire Omont ,  Jim Inoue ,  Jonah Scheinerman ,  Maciej Albin ,  Myles Scolnick ,  Paul Gribelyuk ,  Steven Fackler ,  Tam-Sanh Nguyen ,  Thomas Powell ,  William Seaton

IPC分类号： G05B23/02 ,  G06N20/00 ,  G06Q10/0639 ,  H01L21/66 ,  G06F16/2457 ,  G06F11/07 ,  G06F16/35 ,  G06F16/28

CPC分类号： G05B23/0235 ,  G06N20/00 ,  G06Q10/06395 ,  G06F11/079 ,  G06F16/24578 ,  G06F16/285 ,  G06F16/35 ,  H01L22/20

摘要： Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.

公开(公告)号：US20180173212A1

公开(公告)日：2018-06-21

申请号：US15385664

申请日：2016-12-20

申请人： Palantir Technologies Inc.

发明人： Andrew Poh ,  Andre Frederico Cavalheiro Menck ,  Arion Sprague ,  Benjamin Grabham ,  Benjamin Lee ,  Bianca Rahill-Marier ,  Gregoire Omont ,  Jim Inoue ,  Jonah Scheinerman ,  Maciej Albin ,  Myles Scolnick ,  Paul Gribelyuk ,  Steven Fackler ,  Tam-Sanh Nguyen ,  Thomas Powell ,  William Seaton

IPC分类号： G05B23/02 ,  G06N99/00

CPC分类号： G05B23/0235 ,  G06N20/00 ,  G06Q10/06395

摘要： Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.

公开(公告)号：US20200241518A1

公开(公告)日：2020-07-30

申请号：US16845797

申请日：2020-04-10

申请人： Palantir Technologies, Inc.

发明人： Andrew Poh ,  Andre Frederico Cavalheiro Menck ,  Arion Sprague ,  Benjamin Grabham ,  Benjamin Lee ,  Bianca Rahill-Marier ,  Gregoire Omont ,  Jim Inoue ,  Jonah Scheinerman ,  Maciej Albin ,  Myles Scolnick ,  Paul Gribelyuk ,  Steven Fackler ,  Tam-Sanh Nguyen ,  Thomas Powell ,  William Seaton

IPC分类号： G05B23/02 ,  G06Q10/06 ,  G06N20/00

摘要： Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.

公开(公告)号：US20190206049A1

公开(公告)日：2019-07-04

申请号：US16297308

申请日：2019-03-08

申请人： Palantir Technologies Inc.

发明人： Alexander Taheri ,  Alexandru-viorel Antihi ,  Arion Sprague ,  Benjamin Grabham ,  Benjamin Lee ,  Gregoire Omont ,  Jim Inoue ,  Michael Yang ,  Myles Scolnick ,  Pierre Lucotte ,  Ryan Rowe ,  Tarik Benabdallah ,  Thomas Powell

IPC分类号： G06T7/00 ,  G06F3/0482

CPC分类号： G06T7/0006 ,  G06F3/0482 ,  G06F16/90

摘要： User interfaces for managing defects are provided. A defect selection interface may include a set of defect items for selection by a user. The defect selection interface may include one or more first visuals indicating similarity of the set of defect items to other defect items. An issue selection interface may include a set of issue items for selection by the user. Individual issue items may include one or more defect items added to the individual issue items. A defect comparison interface may include a comparison of a defect item to an issue item. The defect comparison interface may include one or more second visuals indicating similarity of the defect item to the issue item. Based on the user's selection, the defect item may be added to the issue item

公开(公告)号：US10249033B1

公开(公告)日：2019-04-02

申请号：US15448155

申请日：2017-03-02

申请人： Palantir Technologies Inc.

发明人： Alexander Taheri ,  Alexandru Antihi ,  Arion Sprague ,  Benjamin Grabham ,  Benjamin Lee ,  Gregoire Omont ,  Jim Inoue ,  Michael Yang ,  Myles Scolnick ,  Pierre Lucotte ,  Ryan Rowe ,  Tarik Benabdallah ,  Thomas Powell

IPC分类号： G06F3/0482 ,  G06T7/00

摘要： User interfaces for managing defects are provided. A defect selection interface may include a set of defect items for selection by a user. The defect selection interface may include one or more first visuals indicating similarity of the set of defect items to other defect items. An issue selection interface may include a set of issue items for selection by the user. Individual issue items may include one or more defect items added to the individual issue items. A defect comparison interface may include a comparison of a defect item to an issue item. The defect comparison interface may include one or more second visuals indicating similarity of the defect item to the issue item. Based on the user's selection, the defect item may be added to the issue item.