公开(公告)号：US11991457B2

公开(公告)日：2024-05-21

申请号：US17812450

申请日：2022-07-14

申请人： Panasonic Intellectual Property Management Co., Ltd.

发明人： Shinya Nakashima

IPC分类号： H04N23/74 ,  G01N21/89 ,  G06T7/00 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71

CPC分类号： H04N23/74 ,  G01N21/89 ,  G06T7/001 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71 ,  G06T2207/10152 ,  G06T2207/20224 ,  G06T2207/30148 ,  G06V2201/06

摘要： An inspection apparatus includes an illumination device capable of emitting first light in a first wavelength band and reference light in a reference wavelength band overlapping with the first wavelength band, an imaging device that images an inspection body and outputs a pixel signal, and an image processing device. The illumination device emits the first light and the reference light to the inspection body at different timings in one imaging time. The image processing device calculates a first reflectance that is a reflectance in the first wavelength band of the object based on the pixel signal, and determines physical properties of the object based on the first reflectance.

公开(公告)号：US20240276103A1

公开(公告)日：2024-08-15

申请号：US18634332

申请日：2024-04-12

申请人： Panasonic Intellectual Property Management Co., Ltd.

发明人： Shinya Nakashima

IPC分类号： H04N23/74 ,  G01N21/89 ,  G06T7/00 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71

CPC分类号： H04N23/74 ,  G01N21/89 ,  G06T7/001 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71 ,  G06T2207/10152 ,  G06T2207/20224 ,  G06T2207/30148 ,  G06V2201/06

摘要： An inspection apparatus includes an illumination device capable of emitting first light in a first wavelength band and reference light in a reference wavelength band overlapping with the first wavelength band, an imaging device that images an inspection body and outputs a pixel signal, and an image processing device. The illumination device emits the first light and the reference light to the inspection body at different timings in one imaging time. The image processing device calculates a first reflectance that is a reflectance in the first wavelength band of the object based on the pixel signal, and determines physical properties of the object based on the first reflectance.