公开(公告)号：US11991457B2

公开(公告)日：2024-05-21

申请号：US17812450

申请日：2022-07-14

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Shinya Nakashima

IPC: H04N23/74 ,  G01N21/89 ,  G06T7/00 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71

CPC classification number: H04N23/74 ,  G01N21/89 ,  G06T7/001 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71 ,  G06T2207/10152 ,  G06T2207/20224 ,  G06T2207/30148 ,  G06V2201/06

Abstract: An inspection apparatus includes an illumination device capable of emitting first light in a first wavelength band and reference light in a reference wavelength band overlapping with the first wavelength band, an imaging device that images an inspection body and outputs a pixel signal, and an image processing device. The illumination device emits the first light and the reference light to the inspection body at different timings in one imaging time. The image processing device calculates a first reflectance that is a reflectance in the first wavelength band of the object based on the pixel signal, and determines physical properties of the object based on the first reflectance.

公开(公告)号：US12249058B2

公开(公告)日：2025-03-11

申请号：US17338594

申请日：2021-06-03

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Shinya Nakashima

IPC: G06T7/00 ,  H04N23/56

Abstract: An inspection machine includes image sensors that image a sheet, a lighting device that irradiates the sheet with light, and an image processing device that generates an image of an object from outputs of the image sensors. The image processing device generates captured images that include an image in a predetermined range of the sheet in common based on the outputs from the image sensors. The image processing device extracts images of the object on the sheet for each of the generated captured images. The image processing device associates the extracted images of the object with each other based on a feature amount of the object reflected in the images. The image processing device combines the associated images of the object with each other.

公开(公告)号：US20240276103A1

公开(公告)日：2024-08-15

申请号：US18634332

申请日：2024-04-12

Applicant: Panasonic Intellectual Property Management Co., Ltd.

Inventor： Shinya Nakashima

IPC: H04N23/74 ,  G01N21/89 ,  G06T7/00 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71

CPC classification number: H04N23/74 ,  G01N21/89 ,  G06T7/001 ,  G06T7/60 ,  G06V10/60 ,  G06V10/764 ,  H04N23/56 ,  H04N23/71 ,  G06T2207/10152 ,  G06T2207/20224 ,  G06T2207/30148 ,  G06V2201/06

Abstract: An inspection apparatus includes an illumination device capable of emitting first light in a first wavelength band and reference light in a reference wavelength band overlapping with the first wavelength band, an imaging device that images an inspection body and outputs a pixel signal, and an image processing device. The illumination device emits the first light and the reference light to the inspection body at different timings in one imaging time. The image processing device calculates a first reflectance that is a reflectance in the first wavelength band of the object based on the pixel signal, and determines physical properties of the object based on the first reflectance.