METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS
    1.
    发明申请
    METHODS AND SYSTEMS FOR DETERMINING THE AVERAGE ATOMIC NUMBER AND MASS OF MATERIALS 审中-公开
    用于确定平均原子数和材料质量的方法和系统

    公开(公告)号:US20130315377A1

    公开(公告)日:2013-11-28

    申请号:US13855282

    申请日:2013-04-02

    CPC classification number: G01N23/20 G01N23/04 G01N23/20083 G01N23/201

    Abstract: Disclosed herein are methods and systems of scanning a target for potential threats using the energy spectra of photons scattered from the target to determine the spatial distributions of average atomic number and/or mass in the target. An exemplary method comprises: illuminating each of a plurality of voxels of the target with a photon beam; determining an incident flux upon each voxel; measuring the energy spectrum of photons scattered from the voxel; determining, using the energy spectrum, the average atomic number in the voxel; and determining the mass in the voxel using the incident flux, the average atomic number of the material in the voxel, the energy spectrum, and a scattering kernel corresponding to the voxel. An exemplary system may use threat detection heuristics to determine whether to trigger further action based upon the average atomic number and/or mass of the voxels.

    Abstract translation: 本文公开了使用从目标散射的光子的能谱对潜在威胁进行扫描的方法和系统,以确定目标中平均原子数和/或质量的空间分布。 一种示例性方法包括:用光子束照射目标的多个体素中的每一个; 确定每个体素的入射通量; 测量从体素散射的光子的能谱; 使用能谱确定体素中的平均原子数; 并且使用入射磁通量确定体素中的质量,体素中的材料的平均原子数,能谱和对应于体素的散射核。 示例性系统可以使用威胁检测启发式来确定是否基于体素的平均原子数和/或质量触发进一步的动作。

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