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1.Lithographic apparatus and device manufacturing method utilizing dynamic correction for magnification and position in maskless lithography 有权
标题翻译: 平版印刷设备和设备制造方法利用无掩模光刻术中的放大和位置的动态校正公开(公告)号:US20060215142A1
公开(公告)日:2006-09-28
申请号:US11089539
申请日:2005-03-25
申请人: Pieter Willem De Jager , Theodorus Van Den Akker , Willem Venema , Wouter Mulckhuyse , Lambertus Gerardus Kessels
发明人: Pieter Willem De Jager , Theodorus Van Den Akker , Willem Venema , Wouter Mulckhuyse , Lambertus Gerardus Kessels
IPC分类号: G03B27/72
CPC分类号: G03F7/70291 , G03F7/70508
摘要: A lithographic apparatus in which a size and/or a position of features formed on a substrate are adjusted by adjusting an intensity of radiation at boundaries of pattern features.
摘要翻译: 其中通过调节图案特征边界处的辐射强度来调节形成在基底上的特征的尺寸和/或位置的光刻设备。