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公开(公告)号：US11099211B1
公开(公告)日：2021-08-24
申请号：US16659535
申请日：2019-10-21
Applicant: PsiQuantum Corp.
Inventor： Faraz Najafi , Andrea Bahgat Shehata , Stephanie Meng-Yan Teo
Abstract: The various embodiments described herein include methods for testing low temperature components. In some embodiments, a cryogenic testing system includes: (1) a cryostat chamber configured to maintain a sample at temperatures below a threshold temperature, where the sample includes a two-dimensional array of components to be tested, the two-dimensional array comprising a first number (n) of columns and a second number (m) of rows; (2) a probe card including: (a) a set of n column connectors configured to couple to respective columns of the two-dimensional array; and (b) a set of m row connectors configured to couple to respective rows of the two-dimensional array; and (3) a cryogenic connector for communicatively coupling the probe card to a processing unit outside of the cryostat chamber.
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