公开(公告)号：US09689820B2

公开(公告)日：2017-06-27

申请号：US14353713

申请日：2012-10-25

Applicant: Purdue Research Foundation

Inventor： James Michael Caruthers ,  Douglas E. Adams ,  Anand David ,  Peter R. O'Regan ,  Farshid Sadeghi ,  Nathan Daniel Sharp ,  Mark David Suchomel

IPC: G01N25/72 ,  H01M10/04 ,  H01M10/0525 ,  H01M10/058 ,  H01M10/34

CPC classification number: G01N25/72 ,  H01M10/0413 ,  H01M10/0436 ,  H01M10/0525 ,  H01M10/058 ,  H01M10/345

Abstract: Methods and apparatus for the detection of irregularities in a thin film by measurement of transient thermal response.