公开(公告)号：US20150243373A1

公开(公告)日：2015-08-27

申请号：US14187279

申请日：2014-02-23

Applicant: QUALCOMM INCORPORATED

Inventor： DEXTER TAMIO CHUN ,  YANRU LI ,  XIANGYU DONG ,  JUNGWON SUH ,  JUNG PILL KIM ,  DEEPTI VIJAYALAKSHMI SRIRAMAGIRI

IPC: G11C29/44 ,  G06F11/20 ,  G06F11/10

CPC classification number: G11C29/44 ,  G06F11/1048 ,  G06F11/1076 ,  G06F11/2053 ,  G06F12/0246 ,  G06F2212/7209 ,  G11C2029/4402

Abstract: Systems, methods, and computer programs are disclosed for kernel masking dynamic random access memory (DRAM) defects. One such method comprises: detecting and correcting a single-bit error associated with a physical address in a dynamic random access memory (DRAM); receiving error data associated with the physical address from the DRAM; storing the received error data in a failed address table located in a non-volatile memory; and retiring a kernel page corresponding to the physical address if a number of errors associated with the physical address exceeds an error count threshold.

Abstract translation: 公开了用于内核屏蔽动态随机存取存储器（DRAM）缺陷的系统，方法和计算机程序。 一种这样的方法包括：检测和校正与动态随机存取存储器（DRAM）中的物理地址相关联的单位错误; 从DRAM接收与物理地址相关联的错误数据; 将接收到的错误数据存储在位于非易失性存储器中的故障地址表中; 并且如果与物理地址相关联的错误数量超过错误计数阈值，则退出对应于物理地址的内核页面。