公开(公告)号：US20210257007A1

公开(公告)日：2021-08-19

申请号：US16792636

申请日：2020-02-17

Applicant: QUALCOMM Incorporated

Inventor： Anil KOTA ,  Keejong KIM ,  Hochul LEE

IPC: G11C7/06 ,  G11C7/10 ,  G11C17/16 ,  G11C29/14

Abstract: Certain aspects of the present disclosure provide methods and apparatus for testing a one-time programmable (OTP) memory device, including the functionality of a sense amplifier circuit. The OTP memory device includes a memory array, an input latch circuit, and a sense amplifier circuit comprising a current source and a multiplexer. The multiplexer has a first input coupled to an output of the memory array, a second input coupled to the input latch circuit, and an output coupled to an input of the current source circuit.