公开(公告)号：US11237587B1

公开(公告)日：2022-02-01

申请号：US17121580

申请日：2020-12-14

Applicant: QUALCOMM Incorporated

Inventor： Punit Kishore ,  Ankit Goyal ,  Srinivas Patil

IPC: G06F1/04 ,  G06F1/08 ,  G06F1/14

Abstract: Aspects of the disclosure are directed to clock management. In accordance with one aspect, a clock management apparatus for built-in self-test (BIST) circuitry includes a plurality of local clock controllers; a plurality of clock generators coupled to the plurality of local clock controllers; a master clock controller coupled to the plurality of clock generators; an X-tolerant logical built-in self test (XLBIST) circuit coupled to the master clock controller; and a test access port (TAP) coupled to the XLBIST circuit.