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公开(公告)号:US11237587B1
公开(公告)日:2022-02-01
申请号:US17121580
申请日:2020-12-14
Applicant: QUALCOMM Incorporated
Inventor: Punit Kishore , Ankit Goyal , Srinivas Patil
Abstract: Aspects of the disclosure are directed to clock management. In accordance with one aspect, a clock management apparatus for built-in self-test (BIST) circuitry includes a plurality of local clock controllers; a plurality of clock generators coupled to the plurality of local clock controllers; a master clock controller coupled to the plurality of clock generators; an X-tolerant logical built-in self test (XLBIST) circuit coupled to the master clock controller; and a test access port (TAP) coupled to the XLBIST circuit.
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公开(公告)号:US10656203B1
公开(公告)日:2020-05-19
申请号:US16278420
申请日:2019-02-18
Applicant: QUALCOMM Incorporated
Inventor: Punit Kishore , Jais Abraham , Pawan Chhabra
IPC: G01R31/317 , G06F13/42 , G01R31/3177 , H03K19/20
Abstract: Certain aspects of the present disclosure provide an apparatus for processor core testing. The apparatus generally includes a high-speed input-output (HSIO) interface, a general purpose input-output (GPIO) interface, a multiplexer having a first input coupled to the GPIO interface, a test controller coupled between the HSIO interface and a second input of the multiplexer, and one or more processor cores coupled to the output of the multiplexer.
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公开(公告)号:US10996267B2
公开(公告)日:2021-05-04
申请号:US16255214
申请日:2019-01-23
Applicant: QUALCOMM Incorporated
Inventor: Jais Abraham , Punit Kishore
IPC: G01R31/317 , G01R31/3185
Abstract: Certain aspects of the present disclosure provide a circuit for testing processor cores. For example, certain aspects provide a circuit having a deserializer having at least one input coupled to at least one input node of the circuit and having a first plurality of outputs, a plurality of processor cores having inputs coupled to the first plurality of outputs of the deserializer, and a serializer having inputs coupled to a second plurality of outputs of the plurality of processor cores.
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