Digital circuit design with semi-continuous diffusion standard cell
    1.
    发明授权
    Digital circuit design with semi-continuous diffusion standard cell 有权
    数字电路设计采用半连续扩散标准电池

    公开(公告)号:US09190405B2

    公开(公告)日:2015-11-17

    申请号:US14169592

    申请日:2014-01-31

    Abstract: A CMOS device including a standard cell includes first and second transistors with a gate between the first and second transistors. One active region extends between the first and second transistors and under the gate. In a first configuration, when drains/sources of the first and second transistors on the sides of the gate carry the same signal, the drains/sources are connected together and to the gate. In a second configuration, when a source of the first transistor on a side of the gate is connected to a source voltage and a drain/source of the second transistor on the other side of the gate carries a signal, the source of the first transistor is connected to the gate. In a third configuration, when sources of the first and second transistors on the sides of the gate are connected to a source voltage, the gate floats.

    Abstract translation: 包括标准单元的CMOS器件包括在第一和第二晶体管之间具有栅极的第一和第二晶体管。 一个有源区域在第一和第二晶体管之间以及栅极之下延伸。 在第一种配置中,当栅极侧面的第一和第二晶体管的漏极/源极具有相同的信号时,漏极/源极连接在一起并连接到栅极。 在第二配置中,当栅极侧的第一晶体管的源极连接到源极电压时,栅极另一侧的第二晶体管的漏极/源极传送信号时,第一晶体管的源极 连接到门。 在第三种配置中,当栅极侧面的第一和第二晶体管的源极连接到源极电压时,栅极浮动。

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