公开(公告)号：US10312927B1

公开(公告)日：2019-06-04

申请号：US15935988

申请日：2018-03-26

Applicant: QUALCOMM Incorporated

Inventor： Seyed Arash Mirhaj ,  Elias Dagher ,  Yongjian Tang ,  Dinesh Alladi ,  Masoud Ensafdaran ,  Lei Sun ,  Anand Meruva ,  Yuhua Guo ,  Balasubramanian Sivakumar

IPC: H03K4/08 ,  H03M1/10

Abstract: Certain aspects of the present disclosure provide methods and apparatus for calibrating time-interleaved analog-to-digital converter (ADC) circuits and generating a suitable signal for such calibration. Certain aspects provide a signal generator for calibrating a time-interleaved ADC circuit having a plurality of channels. The signal generator generally includes a pattern generator configured to receive a periodic signal and to output a bitstream based on the periodic signal and a conversion circuit having an input coupled to an output of the pattern generator and configured to generate a waveform based on the bitstream. The bitstream has a bit pattern with a total number of bits that shares no common factor with a number of the channels and includes a relatively lower frequency component combined with a relatively higher frequency component.

公开(公告)号：US11095301B1

公开(公告)日：2021-08-17

申请号：US16945090

申请日：2020-07-31

Applicant: QUALCOMM Incorporated

Inventor： Yongjian Tang ,  Chieh-Yu Hsieh ,  Lei Sun ,  Anand Meruva ,  Seyed Arash Mirhaj ,  Yuhua Guo ,  Dinesh Jagannath Alladi

IPC: H03M1/12 ,  H03M1/10 ,  H03M1/06 ,  H03M1/00

Abstract: Certain aspects provide a circuit for analog-to-digital conversion. The circuit generally includes a flash analog-to-digital converter (ADC) having a plurality of comparators, each comparator being configured to compare an input voltage to a reference voltage; and a calibration circuit coupled to the flash ADC and configured to tune the reference voltage prior to a conversion operation by the flash ADC.