公开(公告)号：US09151779B2

公开(公告)日：2015-10-06

申请号：US13675673

申请日：2012-11-13

Applicant: QUALCOMM Incorporated

Inventor： Kyu-Pyung Hwang ,  Young K Song ,  Changhan Hobie Yun ,  Dong Wook Kim

IPC: G01R31/00 ,  G01R1/07

CPC classification number: G01R1/07 ,  G01R31/002

Abstract: Systems and methods for EMC, EMI and ESD testing are described. A probe comprises a center conductor extending along an axis of the probe, a probe tip, and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip. One or more actuators may change the relative positions of the probe tip and shield with respect to a device under test, thereby enabling control of sensitivity and resolution of the probe.

Abstract translation: 描述了用于EMC，EMI和ESD测试的系统和方法。 探针包括沿着探针的轴线延伸的中心导体，探针尖端和与中心导体同轴对准的屏蔽并且被配置为为探针尖端提供电磁屏蔽。 一个或多个致动器可以相对于被测器件改变探头尖端和屏蔽件的相对位置，从而能够控制探头的灵敏度和分辨率。