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1.发明申请Method of detecting an analyte in a sample using semiconductor nanocrystals as a detectable label 审中-公开使用半导体纳米晶体作为可检测标记物检测样品中的分析物的方法公开(公告)号：US20040166505A1
公开(公告)日：2004-08-26
申请号：US10631573
申请日：2003-07-30
Applicant: Quantum Dot Corporation
Inventor： Marcel P. Bruchez , R. Hugh Daniels , Stephen A. Empedocles , Vince E. Phillips , Edith Y. Wong , Donald A. Zehnder
IPC: C12Q001/68
CPC classification number: G01N33/54346 , B82Y15/00 , G01N33/533 , G01N33/588 , G01N2458/00 , Y10S977/924
Abstract: The use of semiconductor nanocrystals as detectable labels in various chemical and biological applications is disclosed. The methods find use for detecting a single analyte, as well as multiple analytes by using more than one semiconductor nanocrystal as a detectable label, each of which emits at a distinct wavelength.
Abstract translation: 公开了在各种化学和生物应用中使用半导体纳米晶体作为可检测标记。 该方法用于通过使用多于一种半导体纳米晶体作为可检测标记来检测单个分析物以及多个分析物，每个分析物以不同的波长发射。
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2.发明申请公开(公告)号：US20010034034A1
公开(公告)日：2001-10-25
申请号：US09887914
申请日：2001-06-21
Applicant: Quantum Dot Corporation
Inventor： Marcel P. Bruchez , R. Hugh Daniels , Stephen A. Empedocles , Vince E. Phillips , Edith Y. Wong , Donald A. Zehnder
IPC: C12Q001/68
CPC classification number: G01N33/54346 , B82Y15/00 , G01N33/533 , G01N33/588 , G01N2458/00 , Y10S977/924
Abstract: The use of semiconductor nanocrystals as detectable labels in various chemical and biological applications is disclosed. The methods find use for detecting a single analyte, as well as multiple analytes by using more than one semiconductor nanocrystal as a detectable label, each of which emits at a distinct wavelength.
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