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公开(公告)号：US11904426B2
公开(公告)日：2024-02-20
申请号：US17975254
申请日：2022-10-27
申请人： RENISHAW PLC
CPC分类号： B23Q17/2485 , G01B11/02 , G01V8/12
摘要： A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.
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公开(公告)号：US11511384B2
公开(公告)日：2022-11-29
申请号：US17274728
申请日：2019-10-07
申请人： RENISHAW PLC
摘要： A non-contact tool measurement apparatus is used in a machine tool environment. The apparatus includes a transmitter including a first aperture and a laser for generating light that is emitted from the transmitter through the first aperture towards a tool-sensing region. A receiver includes an optical detector and is arranged to receive light from the tool-sensing region. A processor analyses the light detected by the optical detector to enable the measurement of tools in the tool-sensing region. The laser is capable of generating light having a wavelength of less than 590 nm thereby enabling the size of the first aperture to be reduced resulting in a reduction in contaminant ingress. In one embodiment, the laser generates blue light.
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