公开(公告)号：US20140299773A1

公开(公告)日：2014-10-09

申请号：US14249046

申请日：2014-04-09

Applicant: RIKEN

Inventor： Kouji NAWATA ,  Hiroaki MINAMIDE ,  Hiromasa ITO ,  Shin'ichiro HAYASHI

IPC: G01J1/04 ,  G01J1/42 ,  G02F1/365

CPC classification number: G01J1/0425 ,  G01J1/42 ,  G01J3/0205 ,  G01J3/18 ,  G01J3/42 ,  G01N21/3581 ,  G02F1/3558 ,  G02F1/365 ,  G02F2001/3548 ,  G02F2203/13

Abstract: The present invention includes a slanted periodically poled device 12 including a light input surface 12a and a light output surface 12b parallel to each other and a terahertz wave input surface 12c orthogonal to the light input surface 12a and the light output surface 12b, a pump beam source 14 which emits pump beam 1 perpendicularly to the light input surface 12a, and a photodetector 16 which detects an up-conversion signal beam A converted from a terahertz wave 3 emitted perpendicularly from the light output surface 12b. The slanted periodically poled device 12 is configured to generate the up-conversion signal beam A in the same direction as and in parallel with the pump beam 1 by quasi phase matching between the terahertz wave 3 perpendicularly incident from the terahertz wave input surface 12c and the pump beam 1.

Abstract translation: 本发明包括一个倾斜的周期极化装置12，它包括彼此平行的光输入表面12a和光输出表面12b以及与光输入表面12a和光输出表面12b正交的太赫波输入表面12c， 源极14，其垂直于光输入表面12a发射泵浦光束1;以及光电检测器16，其检测从从光输出表面12b垂直发射的太赫兹波3转换的上转换信号光束A. 倾斜的周期性极化装置12被配置为通过从太赫兹波输入表面12c垂直入射的太赫兹波3和从太赫兹波输入表面12c的太赫兹波3之间的准相位匹配，在与泵浦光束1相同的方向上产生上变换信号光束A， 泵梁1。

公开(公告)号：US20170307515A1

公开(公告)日：2017-10-26

申请号：US15517925

申请日：2015-10-05

Applicant: RIKEN

Inventor： Kouji NAWATA ,  Hiroaki MINAMIDE ,  Shuzhen FAN ,  Feng QI ,  Hiromasa ITO

IPC: G01N21/17 ,  G02F1/365 ,  G02F1/37 ,  G01N21/3581 ,  G02F1/35

CPC classification number: G01N21/17 ,  G01N21/3581 ,  G02F1/365 ,  G02F1/37 ,  G02F2001/354

Abstract: An optical response measuring device is provided with a light source, first and second wavelength conversion elements, and a light intensity sensor array. The light source generates a pair of light beams including light beams of first and second wavelengths. The first wavelength conversion element generates measurement light of a wavelength whose phase is maintained with relative to the pair of light beams incident thereon. The measurement light is irradiated to an object for measurement. The detected light is then made incident on the second wavelength conversion element. Reference light carries the phase of the pair of light beams and light for which the phase is to be determined in the detection light, from which the second wavelength conversion element generates modulated reference light. The modulated reference light is modulated to have first and second local intensities, which are then measured by the light intensity sensor array.