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公开(公告)号：US08694843B2
公开(公告)日：2014-04-08
申请号：US13198324
申请日：2011-08-04
IPC分类号： G01R31/28
CPC分类号： G01R31/31858 , G06F11/24
摘要： In an embodiment of the invention, a pipelined memory bank is tested by scanning test patterns into an integrated circuit. Test data is formed from the test patterns and shifted into a scan-in chain in the pipelined memory bank. The test data in the scan-in chain is launched into the inputs of the pipelined memory bank during a first clock cycle. Data from the outputs of the pipelined memory bank is captured in a scan-out chain during a second cycle where the time between the first and second clock cycles is equal to or greater than the read latency of the memory bank.
摘要翻译： 在本发明的实施例中，通过将测试图案扫描成集成电路来测试流水线存储器组。 测试数据由测试图形形成并移入流水线存储体中的扫描链。 扫描链中的测试数据在第一个时钟周期内被发送到流水线存储器的输入端。 来自流水线存储体的输出的数据在第二周期的扫描输出链中捕获，其中第一和第二时钟周期之间的时间等于或大于存储体的读取等待时间。
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2.发明申请公开(公告)号：US20130036337A1
公开(公告)日：2013-02-07
申请号：US13198324
申请日：2011-08-04
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/31858 , G06F11/24
摘要： In an embodiment of the invention, a pipelined memory bank is tested by scanning test patterns into an integrated circuit. Test data is formed from the test patterns and shifted into a scan-in chain in the pipelined memory bank. The test data in the scan-in chain is launched into the inputs of the pipelined memory bank during a first clock cycle. Data from the outputs of the pipelined memory bank is captured in a scan-out chain during a second cycle where the time between the first and second clock cycles is equal to or greater than the read latency of the memory bank.
摘要翻译： 在本发明的实施例中，通过将测试图案扫描成集成电路来测试流水线存储器组。 测试数据由测试图形形成并移入流水线存储体中的扫描链。 扫描链中的测试数据在第一个时钟周期内被发送到流水线存储器的输入端。 来自流水线存储体的输出的数据在第二周期的扫描输出链中捕获，其中第一和第二时钟周期之间的时间等于或大于存储体的读取等待时间。
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