公开(公告)号：US09979084B2

公开(公告)日：2018-05-22

申请号：US14557803

申请日：2014-12-02

Applicant: Raytheon Company

Inventor： Thomas V. Sikina ,  Jack J. Schuss ,  Joseph C. Yeh ,  Patrick J. Makridakis

IPC: H01Q3/26 ,  H01Q1/28 ,  H04B7/145 ,  H04B17/12 ,  H04B17/14 ,  H01Q3/00

CPC classification number: H01Q3/267 ,  H01Q1/288 ,  H04B7/145 ,  H04B17/12 ,  H04B17/14

Abstract: Methods and apparatus to calibrate an array by sequentially calibrating elements in a subarray with respect to each other using a satellite. The satellite is repeatedly illuminated for calibrating the elements using reference elements to determine plane fronts from which active elements can be calibrated with respect to each other.

公开(公告)号：US20160156100A1

公开(公告)日：2016-06-02

申请号：US14557803

申请日：2014-12-02

Applicant: Raytheon Company

Inventor： Thomas V. Sikina ,  Jack J. Schuss ,  Joseph C. Yeh ,  Patrick J. Makridakis

IPC: H01Q3/26

CPC classification number: H01Q3/267 ,  H01Q1/288 ,  H04B7/145 ,  H04B17/12 ,  H04B17/14

Abstract: Methods and apparatus to calibrate an array by sequentially calibrating elements in a subarray with respect to each other using a satellite. The satellite is repeatedly illuminated for calibrating the elements using reference elements to determine plane fronts from which active elements can be calibrated with respect to each other.

Abstract translation: 通过使用卫星相对于彼此依次校准子阵列中的元件来校准阵列的方法和装置。 使用参考元件重复照亮卫星以校准元件，以确定可以相对于彼此校准有源元件的平面。