公开(公告)号：US09970821B2

公开(公告)日：2018-05-15

申请号：US14688617

申请日：2015-04-16

Applicant: Raytheon Company

Inventor： Steven F. Cook ,  Colton L. Noble ,  Justan V. Forsyth

IPC: G01J5/00 ,  G01J5/08

CPC classification number: G01J5/0003 ,  G01J5/00 ,  G01J5/0887

Abstract: A high SNR in-situ measurement of sample radiance in a low-temperature ambient environment is used to accurately characterize sample emissivity for transmissive, low-emissivity samples. A low-e mirror is positioned behind the sample such that the sample and low-e mirror overfill the field-of-view (FOV) of the radiometer. The sample is heated via thermal conduction in an open environment. Thermal conduction heats the sample without raising the background radiance appreciably. The low-e mirror presents both a low emission background against which to measure the sample radiance and reflects radiance from the back of the sample approximately doubling the measured signal. The low-e mirror exhibits a reflectance of at least 90% and preferably greater than 98% and an emissivity of at most 7.5% and preferably less than 2% over the spectral and temperature ranges at which the sample emissivity is characterized.

公开(公告)号：US20160305821A1

公开(公告)日：2016-10-20

申请号：US14688617

申请日：2015-04-16

Applicant: Raytheon Company

Inventor： Steven F. Cook ,  Colton L. Noble ,  Justan V. Forsyth

IPC: G01J5/00

CPC classification number: G01J5/0003 ,  G01J5/00 ,  G01J5/0887

Abstract: A high SNR in-situ measurement of sample radiance in a low-temperature ambient environment is used to accurately characterize sample emissivity for transmissive, low-emissivity samples. A low-e mirror is positioned behind the sample such that the sample and low-e mirror overfill the field-of-view (FOV) of the radiometer. The sample is heated via thermal conduction in an open environment. Thermal conduction heats the sample without raising the background radiance appreciably. The low-e mirror presents both a low emission background against which to measure the sample radiance and reflects radiance from the back of the sample approximately doubling the measured signal. The low-e mirror exhibits a reflectance of at least 90% and preferably greater than 98% and an emissivity of at most 7.5% and preferably less than 2% over the spectral and temperature ranges at which the sample emissivity is characterized.

Abstract translation: 在低温环境下采用高信噪比原样测量样品辐射，用于准确表征透射低发射样品的样品辐射率。 低e镜位于样品后面，使得样品和低e镜超过辐射计的视野（FOV）。 样品在开放环境中通过热传导加热。 热传导加热样品，而不会明显提高背景亮度。 低e镜呈现低发射背景，可测量样品辐射，并反射样品背面的辐射率近似将测量信号加倍。 低辐射镜在表征样品辐射率的光谱和温度范围内呈现至少90％，优选大于98％的反射率和至多7.5％，优选小于2％的发射率。

公开(公告)号：US20160103000A1

公开(公告)日：2016-04-14

申请号：US14510180

申请日：2014-10-09

Applicant: RAYTHEON COMPANY

Inventor： Eric C. Fest ,  Page E. King ,  Justan V. Forsyth

IPC: G01D5/30 ,  H04N5/33

CPC classification number: G01D5/30 ,  G01D5/341 ,  H04N5/33

Abstract: Optical position encoding mechanisms and methods for use in reimaged optical imaging systems. In one example, a reimaged optical imaging system includes an imaging detector, an optical component, and at least one light source coupled to the optical component and configured to be reimaged onto the imaging detector, wherein a position of an image of the at least one light source at the imaging detector encodes a position of the optical component relative to the imaging detector.

Abstract translation: 用于再成像光学成像系统的光学位置编码机构和方法。 在一个示例中，重新成像的光学成像系统包括成像检测器，光学部件和耦合到光学部件并且被配置为被重新成像到成像检测器上的至少一个光源，其中至少一个 成像检测器处的​​光源编码光学部件相对于成像检测器的位置。