公开(公告)号：US20150326238A1

公开(公告)日：2015-11-12

申请号：US14802338

申请日：2015-07-17

Applicant: Renesas Electronics Corporation

Inventor： Takahiro UMEZAKI ,  Yasutaka HORIKOSHI ,  Takehiro MIKAMI

IPC: H03M1/10 ,  H03M1/38

CPC classification number: H03M1/109 ,  H03M1/38

Abstract: A microcomputer includes a bus, a CPU (Central Processing Unit) coupled to the bus, a RAM (Random-access Memory) coupled to the bus, and an AD (Analog-to-Digital) converter coupled to the bus. The AD converter includes a switching circuit for switching between an analog signal and a reference potential, a first DA (Digital-to-Analog) converter including a plurality of first capacitors each having one end that can be individually coupled to the switching circuit and the other end coupled to a common output line, one or a plurality of testing capacitors that are dedicated for testing, each having one end to which the reference potential or a potential obtained by dividing the reference potential can be individually inputted, and a control circuit. In a normal mode, the control circuit determines a digital value corresponding to the analog signal, based on the output line.

Abstract translation: 微型计算机包括总线，耦合到总线的CPU（中央处理单元），耦合到总线的RAM（随机存取存储器）和耦合到总线的AD（模拟 - 数字）转换器。 AD转换器包括用于在模拟信号和参考电位之间切换的开关电路，第一DA（数模转换器）转换器包括多个第一电容器，每个第一电容器的一端可单独耦合到开关电路， 另一端耦合到公共输出线，专用于测试的一个或多个测试电容器，每个具有可以单独输入参考电位或通过划分参考电位获得的电位的一端，以及控制电路。 在正常模式下，控制电路基于输出线路确定与模拟信号相对应的数字值。

公开(公告)号：US20150188557A1

公开(公告)日：2015-07-02

申请号：US14577618

申请日：2014-12-19

Applicant: Renesas Electronics Corporation

Inventor： Takahiro UMEZAKI ,  Yasutaka Horikoshi ,  Takehiro Mikami

IPC: H03M1/10 ,  H03M1/38

CPC classification number: H03M1/109 ,  H03M1/38

Abstract: To determine the accuracy of an AD converter more simply than in the related art, a semiconductor device includes a successive approximation AD converter. The AD converter includes one or a plurality of testing capacitors used in a test mode, separately from a C-DAC used for AD conversion in a normal mode. In the test mode, the accuracy of a capacitor under test among a plurality of capacitors configuring the C-DAC is determined by comparing a potential occurring in the capacitor under test and a potential occurring in the testing capacitors.

Abstract translation: 为了比现有技术更简单地确定AD转换器的精度，半导体器件包括逐次逼近AD转换器。 AD转换器包括与在正常模式下用于AD转换的C-DAC分开的在测试模式中使用的一个或多个测试电容器。 在测试模式下，通过比较被测电容器中发生的电位和测试电容器中出现的电位，来确定构成C-DAC的多个电容器中的被测电容器的精度。