-
公开(公告)号：US5994660A
公开(公告)日：1999-11-30
申请号：US974167
申请日：1997-11-19
IPC分类号： B23K28/00
CPC分类号： B23K28/00
摘要： A method for joining metal-matrix composites (MMCs) by using high power x-rays as a volumetric heat source is provided. The method involves directing an x-ray to the weld line between two adjacent MMCs materials to create an irradiated region or melt zone. The x-rays have a power density greater than about 10.sup.4 watts/cm.sup.2 and provide the volumetric heat required to join the MMC materials. Importantly, the reinforcing material of the metal-matrix composites remains uniformly distributed in the melt zone, and the strength of the MMCs are not diminished. In an alternate embodiment, high power x-rays are used to provide the volumetric heat required to weld metal elements, including metal elements comprised of metal alloys. In an alternate embodiment, high power x-rays are used to provide the volumetric heat required to weld metal elements, including metal elements comprised of metal alloys.
摘要翻译： 提供了一种通过使用高功率x射线作为体积热源来连接金属基质复合材料（MMC）的方法。 该方法包括将X射线引导到两个相邻的MMC材料之间的焊接线以产生照射区域或熔融区。 x射线的功率密度大于约104瓦/ cm2，并提供加入MMC材料所需的体积热量。 重要的是，金属基复合材料的增强材料保持均匀分布在熔融区域，并且MMC的强度不会降低。 在替代实施例中，高功率x射线用于提供焊接金属元件所需的体积热量，包括由金属合金组成的金属元件。 在替代实施例中，高功率x射线用于提供焊接金属元件所需的体积热量，包括由金属合金组成的金属元件。
-
公开(公告)号：US08106360B2
公开(公告)日：2012-01-31
申请号：US12789823
申请日：2010-05-28
申请人： Richard A. Rosenberg
发明人： Richard A. Rosenberg
IPC分类号： G01J5/02
摘要： An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled.
摘要翻译： 提供了具有X射线激发或电子激发的红外（IR）发射光谱和显微镜装置，以及用于扩展红外（IR）显微镜的空间关系和通过X射线或电子辐射进行微观红外（IR）分析的改进方法。 通过利用纳米尺寸的X射线束或电子束产生IR发射，IR显微镜的空间分辨率得到延长。 同时执行X射线或电子基光谱学以及结构研究。
-
公开(公告)号：US20100320388A1
公开(公告)日：2010-12-23
申请号：US12789823
申请日：2010-05-28
申请人： Richard A. Rosenberg
发明人： Richard A. Rosenberg
IPC分类号： G01J5/02
摘要： An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled.
摘要翻译： 提供了具有X射线激发或电子激发的红外（IR）发射光谱和显微镜装置，以及用于扩展红外（IR）显微镜的空间关系和通过X射线或电子辐射进行微观红外（IR）分析的改进方法。 通过利用纳米尺寸的X射线束或电子束产生IR发射，IR显微镜的空间分辨率得到延长。 同时执行X射线或电子基光谱学以及结构研究。
-
-
搜索结果
3 条记录 (耗时 0.024 秒)
