公开(公告)号：US20040008816A1

公开(公告)日：2004-01-15

申请号：US10457354

申请日：2003-06-10

Applicant: Rigaku Corporation.

Inventor： Kazuhito Hoshino ,  Yoshio Iwasaki

IPC: G01N023/201

CPC classification number: G01N23/201

Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the molecular structure of the ion-exchange film is determined, thereby to evaluate the performance of the ion-exchange film.

Abstract translation: 本文公开了评价离子交换膜的性能的方法。 在该方法中，通过X射线测量装置获得离子交换膜的小角度散射曲线，该X射线测量装置可以检测相对于施加到膜的X射线的轴以小角度散射的X射线。 从这些峰的小角散射曲线上的峰位置和X射线强度的位置，确定离子交换膜的分子结构，评价离子交换膜的性能。

公开(公告)号：US20040008815A1

公开(公告)日：2004-01-15

申请号：US10456508

申请日：2003-06-09

Applicant: Rigaku Corporation.

Inventor： Kazuhito Hoshino ,  Yoshio Iwasaki

IPC: G01N023/201

CPC classification number: G01N23/201

Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film at different humidities are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to the ion-exchange film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the change in the characteristic of the film, which accompanies change in the molecular structure (hence, ion-exchanging ability) of the ion-exchange film due to the change in humidity, is evaluated. The humidity ambient to the ion-exchange film can be adjusted by a humidity-adjusting device that comprises a vapor source, gas source, gas mixer and gas-introducing pipe.

Abstract translation: 本文公开了评价离子交换膜的性能的方法。 在该方法中，通过X射线测量装置可以获得不同湿度下的离子交换膜的小角度散射曲线，该X射线测量装置可以检测相对于施加到X射线的X射线的轴以小角度散射的X射线 离子交换膜。 从这些峰的小角度散射曲线上的峰位置和X射线强度的位置，伴随着离子的分子结构变化（因此离子交换能力）的膜的特性变化 - 由于湿度变化导致的薄膜被评估。 离子交换膜的湿度环境可以通过包括蒸气源，气源，气体混合器和气体导入管的湿度调节装置来调节。

公开(公告)号：US20010028699A1

公开(公告)日：2001-10-11

申请号：US09829753

申请日：2001-04-10

Applicant: Rigaku Corporation

Inventor： Yoshio Iwasaki

IPC: G21K001/06

CPC classification number: B82Y10/00 ,  G21K1/06 ,  G21K1/062

Abstract: A multilayer mirror 1 that has elliptical reflection faces and provides a divergent angle null of X-rays, is included. The elliptical reflection faces of the multilayer mirror 1 have two focal points. When an X-ray source 2 is arranged at one focal point A, and X-rays that are diverged from the X-ray source 2 are reflected at the multilayer mirror 1, the reflected X-rays converge on another focal point B. The X-ray source 2 is arranged at one focal point A of the multilayer mirror 1. Additionally, a distance L2 from the center of the reflection faces of the multilayer mirror 1 to another focal point B (in other words, convergent point of reflected X-rays) is set to make a convergent angle nullc of X-rays at the focal point B nearly twice as great as the divergent angle null. With the above-noted configuration, both small angle resolution and intensity of incident X-rays to a sample may be optimized, and small angle scattering may be performed with high precision.

Abstract translation: 包括具有椭圆反射面并提供X射线的发散角δ的多层反射镜1。 多层反射镜1的椭圆反射面具有两个焦点。 当在一个焦点A处设置X射线源2，并且在多层反射镜1处反射从X射线源2发散的X射线时，反射的X射线会聚在另一焦点B. X射线源2配置在多层反射镜1的一个焦点A.此外，从多层反射镜1的反射面的中心到另一焦点B的距离L2（换句话说，反射X的收敛点 射线）被设置为使焦点B处的X射线的收敛角度几乎是发散角度δ的两倍。 利用上述构造，可以优化小角度分辨率和入射X射线对样本的强度，并且可以以高精度执行小角度散射。