公开(公告)号：US06330062B1

公开(公告)日：2001-12-11

申请号：US09303260

申请日：1999-04-30

申请人： Robert M. Corn ,  Michael J. Green ,  Stephen C. Weibel ,  Tony G. Frutos

发明人： Robert M. Corn ,  Michael J. Green ,  Stephen C. Weibel ,  Tony G. Frutos

IPC分类号： G01N2155

CPC分类号： G01N21/35 ,  G01N21/359 ,  G01N21/553

摘要： Adsorption of molecules onto a thin metallic surface such as of gold, silver or copper is measured by surface plasmon resonance (SPR) using Fourier Transform (FT) spectroscopy. Reflectance spectra from a prism/metallic film sample surface at a fixed angle of incidence is measured with FT spectroscopy. The reflectance spectrum exhibits a pronounced minimum due to the SPR effect, which can be shifted by changing the angle of incidence or metallic film thickness. The position of the reflectance minimum shifts in wavelength with the adsorption of molecules onto the gold surface due to a change in the index of refraction at the interface. The FT-SPR sensor instrument provides wavelength stability and reproducibility of the resonance wavelength to permit detection of small wavelength shifts, and also substantially increases the spectral range over which the SPR measurements can be made. A beam of broadband radiation from a Michelson interferometer is directed through an SPR sample cell and onto a detector where the output signal is processed using standard FT techniques.

摘要翻译： 使用傅立叶变换（FT）光谱法，通过表面等离子体共振（SPR）测量分子到金，银或铜等金属表面上的吸附。 用FT光谱法测量来自固定入射角的棱镜/金属膜样品表面的反射光谱。 由于SPR效应，反射光谱显示出明显的最小值，可通过改变入射角或金属膜厚度来移动反射光谱。 由于界面处的折射率的变化，反射率最小值的位置随着分子吸附在金表面上而波长的偏移。 FT-SPR传感器仪器提供了波长稳定性和谐振波长的再现性，以允许检测小的波长位移，并且还大大提高可以进行SPR测量的光谱范围。 来自迈克尔逊干涉仪的宽带辐射波束通过SPR采样单元引导到检测器上，其中使用标准FT技术处理输出信号。