Measurement of polarization-resolved optical scattering parameters
    1.
    发明授权
    Measurement of polarization-resolved optical scattering parameters 失效
    偏振分辨光散射参数的测量

    公开(公告)号:US06940594B2

    公开(公告)日:2005-09-06

    申请号:US10174772

    申请日:2002-06-18

    IPC分类号: G01M11/00 G01J4/00

    CPC分类号: G01M11/33

    摘要: Method and apparatus for determining scattering parameters of a scattering matrix of an optical device. A method according to the present invention comprises applying an optical stimulus to a plurality of ports of the optical device, measuring optical fields emerging from the plurality of ports in amplitude and phase, and calculating the scattering parameters using the measured optical fields. The applying step includes applying the optical stimulus to the plurality of ports simultaneously. The method ensures a consistent phase reference for measurement of all of the scattering parameters so that all measurable characteristics of the device can be calculated directly from the scattering parameters.

    摘要翻译: 用于确定光学装置的散射矩阵的散射参数的方法和装置。 根据本发明的方法包括对光学装置的多个端口应用光学激励,测量在幅度和相位上从多个端口出现的光场,并使用所测量的光场计算散射参数。 应用步骤包括同时将光学刺激应用于多个端口。 该方法确保了用于测量所有散射参数的一致的相位参考,从而可以直接从散射参数计算器件的所有可测量特性。