公开(公告)号：US06885728B2

公开(公告)日：2005-04-26

申请号：US10332786

申请日：2001-07-23

Applicant: Roger Hadland ,  Alan Copeland Crawley ,  Ian George Haig ,  Paul Justin Keanly

Inventor： Roger Hadland ,  Alan Copeland Crawley ,  Ian George Haig ,  Paul Justin Keanly

IPC: H01J35/06 ,  H05G1/08 ,  H05G1/10 ,  H05G1/34 ,  H01G1/34

CPC classification number: H01J35/045 ,  H05G1/08 ,  H05G1/10 ,  H05G1/34

Abstract: A compact X-ray source is disclosed, improving controllability and insulation from unwanted high voltage effects. In one aspect, an active variable conductance device (130, 330) connected in series with the cathode is used in a closed loop, feedback arrangement to control the cathode beam current; the current flowing through the device to the cathode being directly sensed and compared with a desired current level. The result of the comparison is used to control the conductance of the device, thereby directly influencing the cathode current. A second aspect provides an extension of a Faraday cage, whereby the secondary winding of a transformer used to supply power to components within the cage is shielded within a coaxial, tubular member connected to the cage and extending outwardly from it.

Abstract translation: 公开了一种紧凑的X射线源，提高了可控性和与不需要的高电压效应的绝缘。 一方面，与阴极串联连接的有源可变电导装置（130,330）用于闭环，用于控制阴极射束电流的反馈装置; 流过器件的阴极被直接感测并与期望的电流水平进行比较。 比较结果用于控制器件的电导，从而直接影响阴极电流。 第二方面提供了法拉第笼的扩展，其中用于向保持架内的部件供电的变压器的次级绕组被屏蔽在连接到保持架并从其向外延伸的同轴管状构件中。

公开(公告)号：US08705693B2

公开(公告)日：2014-04-22

申请号：US12302869

申请日：2007-05-22

Applicant: Roger Hadland

Inventor： Roger Hadland

IPC: G01B15/06

CPC classification number: G01N23/046 ,  G01N2223/419 ,  H01J2235/00

Abstract: The invention provides an automatic system and method using x-ray inspection to image arrays of electrical interconnections on electronic devices. The electron beam of a rotating anode X-ray tube is deflected relative to the anode to cause emission of x-rays from different regions of the anode at different times. The x-ray tube is located at an inspection station for the electronic devices and disposed to irradiate a first part of the array of interconnections with x-rays emitted from a first region of the anode and to irradiate a further part of the array of interconnections with x-rays emitted from another region of the anode. X-rays emerging from the array of interconnections are detected and used to image part at least of the array in order to automatically register interconnection integrity failures and/or detect a performance trend in the formation of the connections. Typically, the arrays of electrical interconnections are established between a ball grid array on the underside of an electronics package and an array of blobs of solder paste on a printed circuit board.

Abstract translation: 本发明提供一种使用X射线检查来在电子设备上成像电互连阵列的自动系统和方法。 旋转阳极X射线管的电子束相对于阳极偏转，从而在不同时间从阳极的不同区域发射X射线。 X射线管位于用于电子设备的检查站处，并设置成用从阳极的第一区域发射的x射线照射互连阵列的第一部分，并且照射互连阵列的另一部分 其中x射线从阳极的另一区域发射。 从互连阵列中出现的X射线被检测并用于对阵列中的至少一部分进行成像，以便自动注册互连完整性故障和/或检测形成连接的性能趋势。 通常，在电子封装的底面上的球栅阵列和印刷电路板上的焊膏团阵列之间建立电互连阵列。