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公开(公告)号：US11175324B2
公开(公告)日：2021-11-16
申请号：US16875009
申请日：2020-05-15
发明人： Benoit Derat
IPC分类号： G01R29/08
摘要： A system for characterizing a quiet zone of an over-the-air testing space includes at least one measurement antenna and at least one scattering member. The measurement antenna is configured to at least transmit electromagnetic signals. The scattering member includes predefined scattering properties. The scattering member is enabled to scatter the electromagnetic signals so as to generate scattered electromagnetic signals that are transmitted in a defined manner. Further, a method of characterizing a quiet zone of an over-the-air testing space is described.
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公开(公告)号：US20210341572A1
公开(公告)日：2021-11-04
申请号：US16862310
申请日：2020-04-29
发明人： Gerhard Hamberger , Matthias Beer , Benoit Derat
IPC分类号： G01S7/40
摘要： A test system for testing a radar sensor comprising a test chamber for encompassing a radar sensor to be tested. A test location is provided within the test chamber on which the radar sensor to be tested is placed for testing. Further, the test system comprises at least one antenna unit and at least one first radar target simulator connected to the antenna unit. The test system also comprises at least one antenna array different to the antenna unit and at least one second radar target simulator connected to the antenna array.
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公开(公告)号：US10935583B2
公开(公告)日：2021-03-02
申请号：US16137210
申请日：2018-09-20
发明人： Corbett Rowell , Vincent Abadie , Benoit Derat
IPC分类号： G01R29/08 , H04B17/00 , H04B7/0413 , H04B17/10
摘要： A measurement system for testing a device under test is described that comprises at least one signal unit for processing a signal, at least two measurement antennas, at least two reflectors, a shielded space, and a testing position for the device under test. Each measurement antenna is orientated with respect to the testing position such that the testing position is located in at least one of a side lobe area and a back lobe area of the measurement antennas. The reflectors are located such that each reflector generates and/or collimates a planar wave at different angles with respect to the testing position. Further, a method for performing test measurements is described.
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公开(公告)号：US20230305056A1
公开(公告)日：2023-09-28
申请号：US17706340
申请日：2022-03-28
发明人： Mert Celik , Hendrik Bartko , Benoit Derat
IPC分类号： G01R31/302 , G01R31/319 , G01R31/317
CPC分类号： G01R31/3025 , G01R31/31713 , G01R31/31908 , G01R31/31917
摘要： A system for over-the-air testing of a device under test includes a measurement antenna, a reference antenna, a device under test capable of wirelessly transmitting and/or receiving complex radio frequency signals, and an analyzer. The analyzer has at least two ports, wherein the reference antenna is connected with a first port of the analyzer. The measurement antenna is connected with a second port of the analyzer. The analyzer is capable of determining a phase difference and a power ratio of radio frequency signals received via the measurement antenna and the reference antenna. The analyzer is capable of performing an IQ analysis on complex radio frequency signals. Further, a method of over-the-air testing of a device under test is disclosed.
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公开(公告)号：US11671186B1
公开(公告)日：2023-06-06
申请号：US17687288
申请日：2022-03-04
发明人： Benoit Derat
CPC分类号： H04B17/0085
摘要： A method of determining an equivalent source associated with a device under test by an over-the-air test (OTA) test system is described. The OTA test system includes an analysis circuit and at least one measurement antenna. The method includes the steps of: conducting, by the at least one measurement antenna, at least two sets of measurements of electromagnetic waves emitted by the device under test, thereby generating measurement signals associated with the electromagnetic waves; determining, by the analysis circuit, at least one radiation parameter of the device under test based on the measurement signals, wherein the at least one radiation parameter is associated with the electromagnetic waves emitted by the device under test; and determining, by the analysis circuit, an equivalent source on a Huygens surface based on the at least one determined radiation parameter, wherein the equivalent source is associated with the device under test. The at least two sets of measurements are conducted on at least two measurement surfaces, wherein the at least two measurement surfaces are different from each other. Further, an OTA test system is described.
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6.发明授权公开(公告)号：US10686540B2
公开(公告)日：2020-06-16
申请号：US16419859
申请日：2019-05-22
发明人： Vincent Abadie , Corbett Rowell , Benoit Derat
IPC分类号： H04B17/29 , H04B7/0413
摘要： This application relates to an anechoic test chamber for testing antennas of a device under test (DUT), the test chamber comprising: a test area having a test surface for receiving the DUT, wherein in a test mode the test surface forms a region of measurement of the DUT and wherein the DUT comprises at least one antenna array having a plurality of multi-input multi-output (MIMO) antennas, at least one reflector compact antenna test range (CATR) comprising a first measurement antenna and one shaped reflector, wherein the reflector is used to generate a first quiet zone, at least one second measurement antenna, wherein the second measurement antenna is arranged inside the test chamber such to generate a second quiet zone at test surface, an input/output terminal for connecting the test chamber to a test equipment, wherein the input/output terminal is connected to the first and second antennas.
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公开(公告)号：US20200158768A1
公开(公告)日：2020-05-21
申请号：US16195576
申请日：2018-11-19
发明人： Benoit Derat , Gerhard Hamberger
IPC分类号： G01R29/10
摘要： A method for correcting a radiation pattern is described by using a system having a device under test with at least one antenna and a measurement antenna. The device under test is located in a placement zone. A radiation pattern of the device under test is measured. A corrected measurement antenna pattern is determined to compensate for an offset of the at least one antenna of the device under test with respect to a coordinate center of the placement zone towards which the measurement antenna is orientated. The corrected measurement antenna pattern is applied on the measured radiation pattern of the device under test to obtain a corrected radiation pattern of the device under test. Furthermore, a system and a computer program for correcting a radiation pattern are described.
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公开(公告)号：US10587050B2
公开(公告)日：2020-03-10
申请号：US15852607
申请日：2017-12-22
发明人： Corbett Rowell , Benoit Derat , Vincent Abadie
摘要： A measurement system is provided. The measurement system comprises a device under test, at least two measurement antennas, and a reflector. In this context, the reflector comprises at least two separate curved surfaces in the same physical entity in order to generate separate plane waves corresponding to the at least two measurement antennas. The reflector is configured in such a manner that the separate plane waves converge in a quiet-zone comprising the device under test.
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公开(公告)号：US20240210460A1
公开(公告)日：2024-06-27
申请号：US18069280
申请日：2022-12-21
发明人： Benoit Derat
CPC分类号： G01R29/105 , G01R29/0871
摘要： An over-the-air (OTA) test system is described. The OTA test system includes an antenna positioner with at least one test antenna. The OTA test system further including a DUT positioner, wherein the DUT positioner is configured to hold a device under test in a measurement zone. The antenna positioner is configured to rotate the at least one test antenna around the measurement zone by adapting an elevation angle of the test antenna. The DUT positioner is configured to tilt the device under test by a predefined angle with respect to a height direction of the OTA test system, thereby adapting an elevation angle of the device under test. Further, an OTA test method is described.
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公开(公告)号：US11698401B1
公开(公告)日：2023-07-11
申请号：US17592747
申请日：2022-02-04
发明人： Benoit Derat , Mert Celik
CPC分类号： G01R29/0892 , G01R29/105
摘要： A method of simulating an effect of interactions between a device under test and a scattering object by of a hybrid over-the-air (OTA) test system is described. The method includes the steps of determining at least one radiation parameter of the device under test, wherein the at least one radiation parameter is associated with electromagnetic waves emitted by the device under test; determining an equivalent source on a Huygens surface based on the at least one determined radiation parameter, wherein the equivalent source is associated with the device under test; assigning material properties to a Huygens box confined by the Huygens surface, wherein the material properties are associated with at least one of reflection of electromagnetic waves and absorption of electromagnetic waves; and simulating an electromagnetic interaction between the device under test and the scattering object based on the determined equivalent source and based on the assigned material properties.
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